 |
数据搜索系统，热门电子元器件搜索 |
|
|
数据搜索系统，热门电子元器件搜索 |
|
STM32H723VG 数据表(PDF) 22 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
STM32H723VG 数据表(HTML) 22 Page - STMicroelectronics |
|
|
22 / 227 page  Functional overview STM32H723xE/G 22/227 DS13313 Rev 2 Error code correction (ECC) Over the product lifetime, and/or due to external events such as radiations, invalid bits in memories may occur. They can be detected and corrected by ECC. This is an expected behavior that has to be managed at final-application software level in order to ensure data integrity through ECC algorithms implementation. SRAM data are protected by ECC: • 7 ECC bits are added per 32-bit word. • 8 ECC bits are added per 64-bit word for AXI-SRAM and ITCM-RAM. The ECC mechanism is based on the SECDED algorithm. It supports single-error correction and double-error detection. |
|
链接网址 |
| ALLDATASHEET是否为您带来帮助? [ DONATE ] |
关于 Alldatasheet | 广告服务 | 联系我们 | 隐私政策 | 数据表链接 | 链接交换 | 制造商名单 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |
Chinese ▼
English
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
Indian
Mexican
British
New Zealand
