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IRFP9240PBF.. 数据表(PDF) 7 Page - Vishay Siliconix |
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IRFP9240PBF.. 数据表(HTML) 7 Page - Vishay Siliconix |
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7 / 11 page ![]() Document Number: 91239 www.vishay.com S11-0444-Rev. B, 14-Mar-11 7 This datasheet is subject to change without notice. THE PRODUCT DESCRIBED HEREIN AND THIS DATASHEET ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000 IRFP9240, SiHFP9240 Vishay Siliconix Fig. 14 - For P-Channel Vishay Siliconix maintains worldwide manufacturing capability. Products may be manufactured at one of several qualified locations. Reliability data for Silicon Technology and Package Reliability represent a composite of all qualified locations. For related documents such as package/tape drawings, part marking, and reliability data, see www.vishay.com/ppg?91239. P.W. Period dI/dt Diode recovery dV/dt Body diode forward drop Body diode forward current Driver gate drive Inductor current D = P.W. Period + - - + Peak Diode Recovery dV/dt Test Circuit • dV/dt controlled by R g • D.U.T. - device under test D.U.T. Circuit layout considerations • Low stray inductance • Ground plane • Low leakage inductance current transformer R g • Compliment N-Channel of D.U.T. for driver V DD • I SD controlled by duty factor “D” Note Note a. V GS = - 5 V for logic level and - 3 V drive devices V GS = - 10 V a D.U.T. l SD waveform D.U.T. V DS waveform V DD Re-applied voltage Ripple ≤ 5 % I SD Reverse recovery current |
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