MF4SAM3 datasheet(12/31 Pages) NXP

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NXP Semiconductors

MF4SAM3

MIFARE SAM AV3 secure access module

MF4SAM3

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Product short data sheet

Rev. 3.0 — 2 August 2019

COMPANY PUBLIC

561930

12 / 31

[1]

IO1, IO2 and IO3 source a transition current when being externally driven from HIGH to LOW. This transition current (ITL) reaches its maximum value

when the input voltage VI is approximately 0.5 VDD. Input current ITL is tested at input voltage VI = 0.5 VDD. Current IIL is tested at input voltage VI = 0.3 V.

Figure 5 shows the input characteristic of this quasi-bidirectional port mode.

[2]

External pull-up resistor 20 kΩ to VDD assumed. The worst case test condition for parameter VOH is present at minimum VDD. For class A supply voltage

conditions VDD = 4.5 V is the worst case with respect to the fix specification limit VOHmin = 3.8 V (0.844 VDD). The supply voltage related limit "0.7 VDD"is a

stricter requirement than the fix value 3.8 V at high VDD values (0.7 VDD = 3.85 V at VDD = 5.5 V). So, in the VDD range 4.5 V to 5.5 V, VOHmin is specified

as "the larger value of 0.7 VDD and 3.8 V, respectively". The VOHmin value (0.7 VDD) cannot be guaranteed in "quasi-bidirectional" mode at an output

current of IOH = -20 μA - the strong output drive mode must be used.

Table 7. Electrical DC characteristics of Inputs CLK and RST_N[1][2]

Conditions: VDD = 1.62 V to 5.5 V; VSS = 0 V; Tamb = -25 °C to +85 °C, unless otherwise specified

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

Inputs CLK (when the IC is not in reset) and RST_N

VIH1

HIGH level input voltage

0.7 VDD

VDD + 0.3 V

VIL1

LOW level input voltage

-0.3

0.25 VDD V

IIH1

HIGH level input current

(weak pull-down is on)

0.7 VDD ≤ VI ≤ VDD;

Test conditions for the maximum

absolute value:

IIH1(max): VI = VDD,

VDD = VDD(max) of the respective

supply voltage class A, B or C

μA

IIL1

LOW level input current

(weak pull-down is on)

0 V ≤ VI ≤ 0.3 VDD;

Test conditions for the maximum

absolute value:

IIL1(max): VI = 0.3 VDD,

VDD = VDD(max) of the respective

supply voltage class A, B or C

μA

II1

Input current

(weak pull-down is on)

0 V ≤ VI ≤ VDD;

Test conditions for the maximum

absolute value:

II1(max): VI = VDD,

VDD = VDD(max) of the respective

supply voltage class A, B or C

μA

IILIH1

Leakage input current at

input voltage beyond VDD

VDD < VI ≤ VDD + 0.3 V; -25 °C ≤

Tamb ≤ +85 °C

Test conditions: VI = VDD + 0.3

VDD = VDD(max) of the respective

supply voltage class A, B or C;

Tamb = +85 °C

μA

IILIL1

Leakage input current at

input voltage below VSS

-0.3 V ≤ VI < 0 V; -25 °C ≤ Tamb ≤

+30 °C

Test conditions: VI = -0.3 V;

VDD = VDD(max) of the respective

supply voltage class A, B or C;

Tamb = +30 °C

-50

μA

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