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LTC4367 数据表(PDF) 20 Page - Analog Devices |
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LTC4367 数据表(HTML) 20 Page - Analog Devices |
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20 / 30 page ![]() LTC7000A 20 Rev. 0 For more information www.analog.com APPLICATIONS INFORMATION Where 3.5V < Rising VCC UVLO < 10.5V. RISING VCC UVLO FALLING VCC UVLO VCCUV RESISTOR TO GROUND (k) 0 30 60 90 120 150 180 210 240 0 1 2 3 4 5 6 7 8 9 10 11 7000A F11 Figure 11. VCCUV Resistor Selection MOSFET Selection The most important parameters in high voltage applica- tions for MOSFET selection are the breakdown voltage BVDSS, on-resistance RDS(ON) and the safe operating area, SOA. The MOSFET, when off, will see the full input range of the input power supply plus any additional ringing than can occur when driving inductive loads. External conduction losses are minimized when using low RDS(ON) MOSFETs. Since many high voltage MOSFETs have higher threshold voltages (typical VTH ≥ 5V) and RDS(ON) is directly related to the (VGS–VTH) of the MOSFET, the LTC7000A/LTC7000A-1 maximum gate drive of greater than 10V makes it an ideal solution to minimize external conduction losses associated with external high voltage MOSFETs. SOA is specified in Typical Characteristic curves in power N-channel MOSFET data sheets. The SOA curves show the relationship between the voltages and current allowed in a timed operation of a power MOSFET without causing damage to the MOSFET. The overcurrent trip point (RSNS and RISET) of the LTC7000A/LTC7000A-1 and TIMER capacitor should be chosen to stay within the SOA region of the MOSFET selected for the application. Limiting Inrush Current During Turn-On Driving large capacitive loads such as complex electrical systems with large bypass capacitors should be powered using the circuit shown in Figure 12. The pull-up gate drive to the power MOSFET from TGUP is passed through an RC delay network, RG and CG, which greatly reduces the turn-on ramp rate of the MOSFET. Since the MOSFET source voltage follows the gate voltage, the load is pow- ered smoothly from ground. This dramatically reduces the inrush current from the source supply and reduces the transient ramp rate of the load allowing for slower activation of sensitive electrical loads. The turn-off of the MOSFET is not affected by the RC delay network as the pull-down for the MOSFET gate is directly from the TGDN pin. Note that the voltage rating on capacitor CG needs to be the same or higher than the external MOSFET and CLOAD. Adding CG to the gate of the external MOSFET can cause high frequency oscillation. A low power, low ohmic value resistor (10Ω) should be placed in series with CG to dampen the oscillations as shown in Figure 12 whenever CG is used in an application. Alternatively, the low ohmic value resistor can be placed in series with the gate of the external MOSFET. CB 1µF CG 0.047µF LOAD 10 SNS+ SNS– RG 100k RFLT 7000A F12 LTC7000A/ LTC7000A-1 RSNS VIN CLOAD 100µF TGUP TGDN BST TS Figure 12. Powering Large Capacitive Loads The values for RG and CG to limit the inrush current can be calculated from the below equation: IIN_RUSH ≅ 0.7 • 12V • CLOAD RG •CG |
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