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ADIN1100CCPZ-R7 数据表(PDF) 35 Page - Analog Devices

部件名 ADIN1100CCPZ-R7
功能描述  Robust, Industrial, Low Power 10BASE-T1L PHY
PDF  78 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADIN1100CCPZ-R7 数据表(HTML) 35 Page - Analog Devices

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Data Sheet
ADIN1100
APPLICATIONS INFORMATION
analog.com
Rev. 0 | 35 of 78
Figure 22. Crystal Oscillator Connection
External Clock Input
If using a single-ended reference clock on XTAL_I/CLK_IN, leave
XTAL_O open circuit. This clock must be an ac-coupled 0.8 V
p-p to 2.5 V p-p sine or (filtered) square wave signal. This signal
also applies when connecting the CLK25_REF output clock from
one 10BASE-T1L device to the XTAL_I/CLK_IN input of another
10BASE-T1L device. When using the RMII MAC interface, a single,
50 MHz reference clock signal (REF_CLK) is required, which can
be sourced from an external MAC chip or from an external refer-
ence clock.
In Figure 23, VS p-p is the peak-to-peak voltage of the clock source.
C1 is the series capacitor from the clock source to XTAL_I/CLK_IN.
C2 is the capacitor from XTAL_I/CLK_IN to ground.
If VS p-p < 2.5 V p-p,
►
C2 is not required
►
C1 = 1 nF
If VS p-p ≥ 2.5 V p-p,
►
C2 = 10 pF
►
C1 = 2.5 (13 pF + CPCBx)/(VS p-p – 2.5)
Figure 23. External Clock Connection
ELECTROMAGNETIC COMPATIBILITY (EMC)
AND ELECTROMAGNETIC IMMUNITY (EMI)
The ADIN1100 was tested at the system level for EMC and EMI.
Table 26 summarizes the results.
Table 26. EMC/EMI Tests Conducted on ADIN1100 at System Level
EMC/EMI Test
Withstand Threshold/Class
IEC 61000-4-4 EFT
±4 kV
IEC 61000-4-2 ESD (contact discharge) ±4 kV
IEC 61000-4-2 ESD (air discharge)
±8 kV
IEC 61000-4-5 Surge
±4 kV
IEC 61000-4-6 Conducted Immunity
10 V/m
IEC 61000-4-3 Radiated Immunity
Class A
EN 55032 Radiated Emissions
Class B



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