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74AC00SCX 数据表(PDF) 3 Page - ON Semiconductor

部件名 74AC00SCX
功能描述  Quad 2-Input NAND Gate
PDF  8 Pages
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制造商  ONSEMI [ON Semiconductor]
网页  http://www.onsemi.com
标志 ONSEMI - ON Semiconductor

74AC00SCX 数据表(HTML) 3 Page - ON Semiconductor

  74AC00SCX Datasheet HTML 1Page - ON Semiconductor 74AC00SCX Datasheet HTML 2Page - ON Semiconductor 74AC00SCX Datasheet HTML 3Page - ON Semiconductor 74AC00SCX Datasheet HTML 4Page - ON Semiconductor 74AC00SCX Datasheet HTML 5Page - ON Semiconductor 74AC00SCX Datasheet HTML 6Page - ON Semiconductor 74AC00SCX Datasheet HTML 7Page - ON Semiconductor 74AC00SCX Datasheet HTML 8Page - ON Semiconductor  
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74AC00, 74ACT00
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3
DC ELECTRICAL CHARACTERISTICS FOR AC
Symbol
Parameter
VCC (V)
Conditions
TA = +25°C
TA = −40°C to +85°C
Unit
Typ.
Guaranteed Limits
VIH
Minimum HIGH Level
Input Voltage
3.0
VOUT = 0.1 V or VCC − 0.1 V
1.5
2.1
2.1
V
4.5
2.25
3.15
3.15
5.5
2.75
3.85
3.85
VIL
Maximum LOW Level
Input Voltage
3.0
VOUT = 0.1 V or VCC − 0.1 V
1.5
0.9
0.9
V
4.5
2.25
1.35
1.35
5.5
2.75
1.65
1.65
VOH
Minimum HIGH Level
Output Voltage
3.0
IOUT = −50 mA
2.99
2.9
2.9
V
4.5
4.49
4.4
4.4
5.5
5.49
5.4
−5.4
3.0
VIN = VIL or VIH, IOH = −12 mA
2.56
2.46
4.5
VIN = VIL or VIH, IOH = −24 mA
3.86
3.76
5.5
VIN = VIL or VIH,
IOH = −24 mA (Note 1)
4.86
4.76
VOL
Maximum LOW Level
Output Voltage
3.0
IOUT = 50 mA
0.002
0.1
0.1
V
4.5
0.001
0.1
0.1
5.5
0.001
0.1
0.1
3.0
VIN = VIL or VIH, IOL = 12 mA
0.36
0.44
4.5
VIN = VIL or VIH, IOL = 24 mA
0.36
0.44
5.5
VIN = VIL or VIH, IOL = 24 mA
(Note 1)
0.36
0.44
IIN
(Note 3)
Maximum Input
Leakage Current
5.5
VI = VCC, GND
±0.1
±1.0
mA
IOLD
Minimum Dynamic
Output Current (Note 2)
5.5
VOLD = 1.65 V Max.
75
mA
IOHD
5.5
VOHD = 3.85 V Min.
−75
mA
ICC
(Note 3)
Maximum Quiescent
Supply Current
5.5
VIN = VCC or GND
2.0
20.0
mA
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
1. All outputs loaded; thresholds on input associated with output under test.
2. Maximum test duration 2.0 ms, one output loaded at a time.
3. IIN and ICC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V VCC.



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