ASM330LHH datasheet(16/84 Pages) STMICROELECTRONICS

16 / 84 page

Module specifications

ASM330LHH

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DocID031239 Rev 4

2. Sensitivity values after factory calibration test and trimming.

3. Subject to change.

4. Measurements are performed in a uniform temperature setup and they are based on characterization data in a limited

number of samples. Not measured during final test for production.

5. Across temperature and life. Assuming post-solder effect compensated at the end of production line.

6. Gyroscope rate noise density is independent of the ODR for FS up to ±2000 dps, max value specified at ambient

temperature.

7. Based on characterization data on a limited number of samples. Not measured during final test for production. See

Section 10: Typical performance characteristics for typical distributions.

8. Accelerometer noise density is independent of the ODR, max value specified at ambient temperature.

9. The sign of the linear acceleration self-test output change is defined by the STx_XL bits in a dedicated register for all axes.

10. The linear acceleration self-test output change is defined with the device in stationary condition as the absolute value of:

OUTPUT[LSb] (self-test enabled) - OUTPUT[LSb] (self-test disabled). 1LSb = 0.061 mg at ±2 g full scale.

11. Accelerometer self-test limits are full-scale independent.

12. The self-test output change limits include full Vdd range and impact of soldering.

13. The sign of the angular rate self-test output change is defined by the STx_G bits in a dedicated register for all axes.

14. The angular rate self-test output change is defined with the device in stationary condition as the absolute value of:

OUTPUT[LSb] (self-test enabled) - OUTPUT[LSb] (self-test disabled). 1LSb = 70 mdps at ±2000 dps full scale.

ASM330LHH 数据表(PDF) 16 Page - STMicroelectronics