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REF70 数据表(PDF) 18 Page - Texas Instruments

部件名 REF70
功能描述  REF70 2 ppm/°C Maximum Drift, 0.23 ppmp-p 1/f Noise, Precision Voltage Reference
PDF  41 Pages
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制造商  TI [Texas Instruments]
网页  http://www.ti.com
标志 TI - Texas Instruments

REF70 数据表(HTML) 18 Page - Texas Instruments

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8.2 Long-Term Stability
One of the key parameters of the REF70 references is long-term stability also known as long-term drift. The
long-term stability value was tested in a typical setup that reflects standard PCB board manufacturing practices.
The boards are made of standard FR4 material and the board does not have special cuts or grooves around the
devices to relieve the mechanical stress of the PCB. The devices and boards in this test do not undergo high
temperature burn in post-soldering prior to testing. These conditions reflect a real world use case scenario and
common manufacturing techniques.
During the long-term stability testing, precautions are taken to ensure that only the long-term stability drift is
being measured. The boards are maintained at 35°C in an oil bath. The oil bath ensures that the temperature
is constant across the device over time compared to an air oven. The measurements are captured every 30
minutes with a calibrated 8.5 digit multimeter.
Typical long-term stability characteristic is expressed as a deviation over time. Figure 8-3 shows the typical drift
value for the REF70 FKH VOUT is 35 ppm from 0 to 1000 hours. It is important to understand that long-term
stability is not ensured by design and that the value is typical. The REF70 will experience the highest drift in the
initial 1000 hr. Subsequent deviation is typically lower than 13 ppm for the next 1000 hr.
Time (hr)
0
800
1600
2400
3200
4000
-200
-150
-100
-50
0
50
100
150
200
Figure 8-3. Long Term Stability LCCC -4000 hours (VOUT)
8.3 Thermal Hysteresis
Thermal hysteresis is measured with the REF70 FKH soldered to a PCB, similar to a real-world application.
Thermal hysteresis for the device is defined as the change in output voltage after operating the device at 25°C,
cycling the device through the specified temperature range, and returning to 25°C. This can be seen in Figure
8-4 to Figure 8-5. Hysteresis can be expressed by Equation 1:
6
PRE
POST
HYST
NOM
| V
V
|
V
10
ppm
V
§
·
u
¨
¸
©
¹
(1)
where
• VHYST = thermal hysteresis (in units of ppm)
• VNOM = the specified output voltage
• VPRE = output voltage measured at 25°C pre-temperature cycling
• VPOST = output voltage measured after the device has cycled from 25°C through the specified temperature
range of –40°C to +125°C and returns to 25°C.
REF70
SNAS781E – OCTOBER 2020 – REVISED JULY 2022
www.ti.com
18
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Copyright © 2022 Texas Instruments Incorporated
Product Folder Links: REF70



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