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STF18N60DM2 数据表(PDF) 7 Page - STMicroelectronics |
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STF18N60DM2 数据表(HTML) 7 Page - STMicroelectronics |
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7 / 12 page ![]() 3 Test circuits Figure 13. Test circuit for resistive load switching times AM01468v1 VD RG RL D.U.T. 2200 μF VDD 3.3 μF + pulse width VGS Figure 14. Test circuit for gate charge behavior AM01469v1 47 kΩ 1 kΩ 47 kΩ 2.7 kΩ 1 kΩ 12 V IG= CONST 100 Ω 100 nF D.U.T. + pulse width VGS 2200 μF VG VDD Figure 15. Test circuit for inductive load switching and diode recovery times AM01470v1 A D D.U.T. S B G 25 Ω A A B B RG G D S 100 µH µF 3.3 1000 µF VDD D.U.T. + _ + fast diode Figure 16. Unclamped inductive load test circuit AM01471v1 VD ID D.U.T. L VDD + pulse width Vi 3.3 µF 2200 µF Figure 17. Unclamped inductive waveform AM01472v1 V(BR)DSS VDD VDD VD IDM ID Figure 18. Switching time waveform AM01473v1 0 VGS 90% VDS 90% 10% 90% 10% 10% ton td(on) tr 0 toff td(off) tf STF18N60DM2 Test circuits DS10966 - Rev 5 page 7/12 |
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