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2ST15300 数据表(PDF) 4 Page - STMicroelectronics

部件名 2ST15300
功能描述  Rad-Hard 300 V, 5 A NPN bipolar transistor
PDF  9 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

2ST15300 数据表(HTML) 4 Page - STMicroelectronics

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Radiation hardness assurance
This products is guaranteed in radiation as per ESCC 22900 and in compliance with ESCC 5201/020
specification. Each lot is tested in radiation according to the following procedure:
Standard dose rate window (typical at 0.1 rad / sec.)
Test of 11 samples (5 biased at 80% of BVceo, 5 unbiased and 1 for reference)
Acceptance criteria in compliance with the post radiation electrical characteristics as per Table 4.
Table 4. ESCC 5201/020 post radiation electrical characteristics (Tamb = 25 °C unless otherwise specified)
Symbol
Parameter
Test conditions
Min.
Max.
Unit
ICBO
Collector-base cut-off current
(IE = 0)
VCB = 240 V
10
µA
IEBO
Emitter-base cut-off current
(IC = 0)
VEB = 6 V
50
µA
V(BR)CBO
Collector-base breakdown
voltage (IE = 0)
IC = 10 mA
240
V
V(BR)CEO (1)
Collector-emitter breakdown
voltage (IB = 0)
IC = 10 mA
100
V
V(BR)EBO
Emitter-base breakdown
voltage (IC = 0)
IE = 10 μA
6
V
VCE(sat) (1)
Collector-emitter saturation
voltage
IC = 5 A, IB = 1 A
0.7
V
VBE(sat) (1)
Base-emitter saturation
voltage
IC = 5 A, IB = 1 A
1.4
V
[hFE]
Post irradiation gain
calculation(2)
IC = 50 mA, VCE = 0.6 V
[25]
IC = 250 mA, VCE =0.6 V
[27.5]
IC = 5 A, VCE = 5 V
[27.5]
IC = 5 A, VCE = 5 V
[17.5]
1. Pulse test: pulse duration ≤ 300 μs, duty cycle ≤ 2%.
2. The post-irradiation gain calculation [hFE] is made according to MILSTD-750 test method 1019.
2ST15300
Radiation hardness assurance
DS13014 - Rev 6
page 4/9



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