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DF2S5M4FS 数据表(PDF) 4 Page - Toshiba Semiconductor

部件名 DF2S5M4FS
功能描述  ESD Protection Diodes Silicon Epitaxial Planar
PDF  9 Pages
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制造商  TOSHIBA [Toshiba Semiconductor]
网页  http://www.semicon.toshiba.co.jp/eng
标志 TOSHIBA - Toshiba Semiconductor

DF2S5M4FS 数据表(HTML) 4 Page - Toshiba Semiconductor

  DF2S5M4FS Datasheet HTML 1Page - Toshiba Semiconductor DF2S5M4FS Datasheet HTML 2Page - Toshiba Semiconductor DF2S5M4FS Datasheet HTML 3Page - Toshiba Semiconductor DF2S5M4FS Datasheet HTML 4Page - Toshiba Semiconductor DF2S5M4FS Datasheet HTML 5Page - Toshiba Semiconductor DF2S5M4FS Datasheet HTML 6Page - Toshiba Semiconductor DF2S5M4FS Datasheet HTML 7Page - Toshiba Semiconductor DF2S5M4FS Datasheet HTML 8Page - Toshiba Semiconductor DF2S5M4FS Datasheet HTML 9Page - Toshiba Semiconductor  
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DF2S5M4FS
4
7.
7.
7.
7. Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, T
Absolute Maximum Ratings (Note) (Unless otherwise specified, Taaaa = 25
= 25
= 25
= 25 
))))
Characteristics
Electrostatic discharge voltage (IEC61000-4-2) (Contact)
Electrostatic discharge voltage (IEC61000-4-2) (Air)
Electrostatic discharge voltage (ISO10605) (Contact)
Electrostatic discharge voltage (ISO10605) (Air)
Peak pulse power (tp = 8/20 µs)
Peak pulse current (tp = 8/20 µs)
Junction temperature
Storage temperature
Symbol
VESD
PPK
IPP
Tj
Tstg
Note
(Note 1)
(Note 2)
(Note 3)
Rating
±20
±30
30
2
150
-55 to 150
Unit
kV
kV
W
A
Note:
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: According to IEC61000-4-2.
Note 2: According to ISO10605.
Note 3: According to IEC61000-4-5.
2019-11-01
Rev.2.0
©2019
Toshiba Electronic Devices & Storage Corporation



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