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LCR1210-R100F 数据表(PDF) 36 Page - Skyworks Solutions Inc.

部件名 LCR1210-R100F
功能描述  SINGLE-CHIP DUAL PROSLIC®
PDF  59 Pages
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制造商  SKYWORKS [Skyworks Solutions Inc.]
网页  http://www.skyworksinc.com
标志 SKYWORKS - Skyworks Solutions Inc.

LCR1210-R100F 数据表(HTML) 36 Page - Skyworks Solutions Inc.

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Si32260/1
36
Skyworks Solutions, Inc. • Phone [781] 376-3000 • Fax [781] 376-3100 • sales@skyworksinc.com • www.skyworksinc.com
Rev. 1.4 • Skyworks Proprietary Information • Products and Product Information are Subject to Change Without Notice • October 7, 2021
5.17. In-Circuit and Metallic Loop Testing
(MLT)
A rich set of features is provided for in-circuit testing of
the FXS system and the connected telephone line
(MLT):
Tone generators
Audio diagnostic filters
Digital and analog loop-back modes
Internal test load
Monitor ADC
DSP algorithms
Using these facilities, it is possible to test the
Si32260/1’s dc-dc converter, codec, line-feed, PCM bus
interface, DSP, SPI bus interface, and call progress
state-machine as well as testing the connected
telephone line and external protection circuitry.
The audio diagnostic filters on the FXS are intended to
provide programmable filtering of the TX digital audio
signal and calculate the peak and/or average signal
power of the filters’ outputs. The signal powers are then
compared
to
programmable
thresholds.
The
programmable filters can be used to band-pass filter a
certain tone or notch out certain tones, so that the signal
power measurements are frequency selective. This
filtering is useful in a telephony system because it can
measure harmonic distortion, intermodulation, noise,
etc.
The Si32260/1 incorporates an internal test load with a
2.2 k
 nominal value that can be connected across
Tip/Ring (Figure 24). The audio diagnostics system and
built-in test load can be used to test the FXS interface
(Si32260/1) itself without requiring an external load, a
connected line, or any relays. This facility can be used
for production and in-service testing of such things as:
Dial tone draw/break
Audio quality measurements
Pulse digit detection
DC feed
Ringtrip
Polarity reversal
Transmission loss
MLT, e.g., GR-909, is facilitated by the built-in DSP,
monitor ADC, and test load. They provide the ability to
detect multiple fault conditions within the CPE as well as
on the Tip/Ring pair (T-R). Thirteen different measured
and/or calculated parameters are reported by the
Monitor ADC. Host software for use in conjunction with
the ProSLIC API is available from Skyworks Solutions.
Typical MLT tests include:
Hazardous Potential Test – This checks for ac
voltage > 50 VRMS or dc voltage > 135 V between
Tip and Ground (T-G) or Ring and Ground (R-G).
Foreign Electromotive Force Test – Checks T-G or
R-G for ac voltage > 10 VRMS or dc voltage > 6 V.
Uses same threshold as for hazardous voltage test.
Resistive Faults Test – Checks for dc resistance
from T-R, T-G or R-G. Any measurement < 150 k
 is
considered a resistive fault.
Receiver-Off-Hook Test – Distinguishes between a
T-R resistive fault and an off-hook condition.
Ringers Test – Measures the magnitude of the
connected ring load (REN) across T-R. Results are
> 0.175 REN and < 5 REN for a valid load
AC Line Impedance (line length) – T-R, T-G, and R-
G. Generates a tone at several specific frequencies
(audio band) and measures the reflected signal
amplitude (complex spectrum) that comes back (with
transhybrid balance filter disabled). The reflected
signal is then used to calculate the line impedance
based on certain assumptions of wire gauge, etc.
Line Capacitance – T-R, T-G, R-G. Generates a
linear ramp function with polarity reversal, and
measures the time constant.
Diagnostic information is available even in the presence
of fault conditions that cause the system’s protection
devices (fuses, PTCs, etc.) to open. A high-impedance
sensing path (pins SRINGC and STIPC) can be used to
measure the conditions on Tip/Ring even when the FXS
system is effectively disconnected from the line. No
relay is required and this sensing path inherently meets
Dielectric Withstand per GR-49 (> 1000 V).
Figure 24. Si32260/1 Internal Test Load Circuit
TIP
RING
Test Load
RTL = 2.2 k (typical)



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