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74ALVT16245DL 数据表(PDF) 6 Page - NXP Semiconductors |
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74ALVT16245DL 数据表(HTML) 6 Page - NXP Semiconductors |
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6 / 12 page ![]() Philips Semiconductors Product specification 74ALVT16245 2.5V/3.3V 16-bit transceiver (3-State) 1998 Feb 13 6 DYNAMIC SWITCHING THRESHOLD Dynamic switching threshold is the change in VIH and VIL when the device is operated in various switching and output loading conditions. The cause of this variation is due to extra load placed on internal circuit structures. VIHD and VILD are measures of the dynamic switching threshold. VIHD is the input high switching level when the device is heavily loaded. VILD is the input low switching level when the device is heavily loaded. VILD/VIHD vs VCC Vild - - - - Vihd VCC (V) 0.0 0.5 1.0 1.5 2.0 2.5 3.0 2.3 Vild/Vihd vs VCC 2.5 2.7 3.0 3.3 3.6 SA00455 GROUND/VCC BOUNCE VOLP vs Temperature 2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0.0 –55 –40 25 85 125 Temperature ( °C) SA00457 VOHV vs Temperature 4.0 3.5 3.0 2.5 1.0 –55 –40 25 85 125 Temperature ( °C) 1.5 2.0 SA00458 VILD/VIHD vs Frequency Temp = 25 °C Vild - - - - Vihd Vild/Vihd vs Frequency – T = 25 °C Frequency (MHz) 0.00 0.50 1.00 1.50 2.00 2.50 3.00 5 20 40 60 80 100 120 SA00456 VOLP vs Capacitive Load 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0 150pF 270pF Capacitive Load (pF) 50pF SA00459 VOHV vs Capacitive Load 4.0 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0.0 50pF 150pF 270pF Capacitive Load (pF) SA00460 |
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