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N74F393D 数据表(PDF) 4 Page - NXP Semiconductors

部件名 N74F393D
功能描述  Dual 4-bit binary ripple counter
PDF  8 Pages
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制造商  PHILIPS [NXP Semiconductors]
网页  http://www.nxp.com
标志 PHILIPS - NXP Semiconductors

N74F393D 数据表(HTML) 4 Page - NXP Semiconductors

  N74F393D Datasheet HTML 1Page - NXP Semiconductors N74F393D Datasheet HTML 2Page - NXP Semiconductors N74F393D Datasheet HTML 3Page - NXP Semiconductors N74F393D Datasheet HTML 4Page - NXP Semiconductors N74F393D Datasheet HTML 5Page - NXP Semiconductors N74F393D Datasheet HTML 6Page - NXP Semiconductors N74F393D Datasheet HTML 7Page - NXP Semiconductors N74F393D Datasheet HTML 8Page - NXP Semiconductors  
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Philips Semiconductors
Product specification
74F393
Dual 4-bit binary ripple counter
1988 Nov 01
4
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
UNIT
VO
High level output voltage
VCC = MIN, VIL = MAX
±10%VCC
2.5
V
VOH
High-level output voltage
VIH = MIN, IOH = MAX
±5%VCC
2.7
3.4
V
VO
Low level output voltage
VCC = MIN, VIL = MAX
±10%VCC
0.30
0.50
V
VOL
Low-level output voltage
VIH = MIN, IOL = MAX
±5%VCC
0.30
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
100
µA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–0.6
mA
IOS
Short-circuit output current3
VCC = MAX
–60
–150
mA
ICC
Supply current (total)
ICCH
VCC = MAX
25
36
mA
ICC
Supply current (total)
ICCL
VCC = MAX
42
58
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
VCC = +5V
Tamb = +25°C
CL = 50pF, RL = 500Ω
VCC = +5V ± 10%
Tamb = 0°C to +70°C
CL = 50pF, RL = 500Ω
UNIT
MIN
TYP
MAX
MIN
MAX
fMAX
Maximum clock frequency
Waveform 1
100
130
100
MHz
tPLH
tPHL
Propagation delay
CPn to Q0a or Q0b
Waveform 1
3.5
5.0
5.5
7.0
8.0
10.0
3.5
5.0
9.0
10.5
ns
tPLH
tPHL
Propagation delay
CPn to Q1a, Q1b
Waveform 1
5.0
7.5
7.0
9.5
10.0
12.0
4.5
7.0
13.0
13.0
ns
tPLH
tPHL
Propagation delay
CPn to Q2a, Q2b
Waveform 1
8.0
9.5
10.0
11.5
13.0
14.5
7.0
9.0
15.0
15.5
ns
tPLH
tPHL
Propagation delay
CPn to Q3a, Q3b
Waveform 1
10.5
12.0
12.5
14.0
15.5
16.5
10.0
11.5
17.0
17.5
ns
tPHL
Propagation delay
MR to Qna, Qnb
Waveform 2
4.0
6.0
9.0
4.0
9.0
ns



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