HCS139MS

FN3560 Rev 1.00

Page 5 of 9

September 1995

Input Leakage Current

IIN

VCC = 5.5V, VIN = VCC or GND

+25oC-

5

A

Noise Immunity

Functional Test

FN

VCC = 4.5V, VIH = 3.15V,

VIL = 1.35V, (Note 3)

+25oC

---

Propagation Delay

A0, A1 to Output

TPHL,

TPLH

VCC = 4.5V

+25oC

2

27

ns

Propagation Delay

Enable to Output

TPHL,

TPLH

VCC = 4.5V

+25oC

2

27

ns

NOTES:

1. All voltages referenced to device GND.

2. AC measurements assume RL = 500

, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC

3. For functional tests VO

4.0V is recognized as a logic “1”, and VO 0.5V is recognized as a logic “0”.

TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25oC)

PARAMETER

GROUP B

SUBGROUP

DELTA LIMIT

ICC

5

12

A

IOL/IOH

5

-15% of 0 Hour

TABLE 6. APPLICABLE SUBGROUPS

CONFORMANCE GROUPS

METHOD

GROUP A SUBGROUPS

READ AND RECORD

Initial Test (Preburn-In)

100%/5004

1, 7, 9

ICC, IOL/H, IOZL/H

Interim Test I (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H, IOZL/H

Interim Test II (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H, IOZL/H

PDA

100%/5004

1, 7, 9, Deltas

Interim Test III (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H, IOZL/H

PDA

100%/5004

1, 7, 9, Deltas

Final Test

100%/5004

2, 3, 8A, 8B, 10, 11

Group A (Note 1)

Sample/5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

Group B

Subgroup B-5

Sample/5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample/5005

1, 7, 9

Group D

Sample/5005

1, 7, 9

NOTE:

1. Alternate Group A testing in accordance with Method 5005 of Mil-Std-883 may be exercised.

TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)

PARAMETER

SYMBOL

(NOTES 1, 2)

CONDITIONS

TEMPERATURE

200K RAD

LIMITS

UNITS

MIN

MAX