HCS154MS

FN2479 Rev 3.00

Page 5 of 8

January 6, 2011

TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25°C)

PARAMETER

GROUP B SUBGROUP

DELTA LIMIT

ICC

5

12A

IOL/IOH

5

-15% of 0 Hour

TABLE 6. APPLICABLE SUBGROUPS

CONFORMANCE GROUPS

METHOD

GROUP A SUBGROUPS

READ AND RECORD

Initial Test (Preburn-In)

100%/5004

1, 7, 9

ICC, IOL/H

Interim Test I (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H

Interim Test II (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H

PDA

100%/5004

1, 7, 9, Deltas

Interim Test III (Postburn-In)

100%/5004

1, 7, 9

ICC, IOL/H

PDA

100%/5004

1, 7, 9, Deltas

Final Test

100%/5004

2, 3, 8A, 8B, 10, 11

Group A (Note 8)

Sample/5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11

Group B

Subgroup B-5

Sample/5005

1, 2, 3, 7, 8A, 8B, 9, 10, 11,

Deltas

Subgroups 1, 2, 3, 9, 10, 11

Subgroup B-6

Sample/5005

1, 7, 9

Group D

Sample/5005

1, 7, 9

NOTE:

8. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.

TABLE 7. TOTAL DOSE IRRADIATION

CONFORMANCE

GROUPS

METHOD

TEST

READ AND RECORD

PRE RAD

POST RAD

PRE RAD

POST RAD

Group E Subgroup 2

5005

1, 7, 9

See “DC Post Radiation

Electrical Performance

Characteristics” table on page 4

1, 9

See “DC Post Radiation Electrical

Performance Characteristics” table

on page 4 (Note 9)

NOTE:

9. Except FN test which will be performed 100% Go/No-Go.

TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS

OPEN

GROUND

1/2 VCC = 3V  0.5V

VCC = 6V  0.5V

OSCILLATOR

50kHz

25kHz

STATIC BURN-IN I TEST CONDITIONS (Note 10)

1 - 11, 13 - 17

12, 18 - 23

-

24

-

-

STATIC BURN-IN II TEST CONNECTIONS (Note 10)

1 - 11, 13 - 17

12

-

18 - 24

-

-

DYNAMIC BURN-IN I TEST CONNECTIONS (Note 11)

-

12, 18 - 21

1 - 11, 13 - 17

24

23

22

NOTES:

10. Each pin except VCC and GND will have a resistor of 10k  5% for static burn-in.

11. Each pin except VCC and GND will have a resistor of 1k  5% for dynamic burn-in.

TABLE 9. IRRADIATION TEST CONNECTIONS

OPEN

GROUND

VCC = 5V  0.5V

1 - 11, 13 - 17

12

18 - 24

NOTE: Each pin except VCC and GND will have a resistor of 47k  5% for irradiation testing. Group E, Subgroup 2, sample size

is 4 dice/wafer 0 failures.