HCS32MS

FN3057 Rev 1.00

Page 6 of 11

April 11, 2007

Total Dose Irradiation

CONFORMANCE GROUPS

METHOD

TEST

READ AND RECORD

PRE RAD

POST RAD

PRE RAD

POST RAD

Group E Subgroup 2

5005

1, 7, 9

DC Post Radiation

Electrical Performance

Characteristics on page 4

1, 9

DC Post Radiation

Electrical Performance

Characteristics on

page 4 (Note 13)

NOTES:

13. Except FN test which will be performed 100% Go/No-Go.

Static And Dynamic Burn-In Test Connections

OPEN

GROUND

1/2 VCC = 3V

 0.5V

VCC = 6V

 0.5V

OSCILLATOR

50kHz

25kHz

STATIC BURN-IN I TEST CONNECTIONS (Note 14)

3, 6, 8, 11

1, 2, 4, 5, 7, 9, 10, 12,

13

-14

-

-

STATIC BURN-IN II TEST CONNECTIONS (Note 14)

3, 6, 8, 11

7

-

1, 2, 4, 5, 9, 10, 12, 13,

14

--

DYNAMIC BURN-IN TEST CONNECTIONS (Note 15)

-

7

3, 6, 8, 11

14

1, 2, 4, 5, 9, 10, 12,

13

-

NOTES:

14. Each pin except VCC and GND will have a resistor of 10k

  5% for static burn-in

15. Each pin except VCC and GND will have a resistor of 1k

  5% for dynamic burn-in

Irradiation Test Conditions

OPEN

GROUND

VCC = 5V ± 0.5V

3, 6, 8, 11

7

1, 2, 4, 5, 9, 10, 12, 13, 14

NOTES:

16. Each pin except VCC and GND will have a resistor of 47K

  5% for irradiation testing. Group E, Subgroup 2, sample size is 4 dice/wafer 0

failures.