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ADG2108BCPZ-R2 数据表(PDF) 15 Page - Analog Devices |
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ADG2108BCPZ-R2 数据表(HTML) 15 Page - Analog Devices |
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15 / 28 page ![]() ADG2108 Rev. 0 | Page 15 of 28 TEST CIRCUITS The test circuits show measurements on one channel for clarity, but the circuit applies to any of the switches in the matrix. XY VS RON = V1/IDS IDS V1 Figure 25. On Resistance XY VX VY IOFF A A IOFF Figure 26. Off Leakage XY VY NC ION A Figure 27. On Leakage VX XY VOUT 50% 90% 9TH DATA BIT GND 0.1µF 0.1µF VSS VOUT VDD VSS VDD CL 35pF RL 300Ω tOFF AND tON Figure 28. Switching Times, tON, tOFF XY VX CL 1nF RX QINJ =CL × ΔVOUT ΔVOUT GND 0.1 µF0.1µF VSS VSS VDD VDD VOUT SW ON DATA BIT VOUT SW OFF Figure 29. Charge Injection VX 50Ω RL 50Ω V X Y 0.1µF VS VOUT OFF ISOLATION = 20 log NETWORK ANALYZER 0.1µF VSS VSS 50Ω VDD VDD VOUT GND Figure 30. Off Isolation VX 50Ω RL 50Ω V X Y 0.1µF VOUT WITHOUT SWITCH VOUT WITH SWITCH INSERTION LOSS = 20 log NETWORK ANALYZER 0.1µF VSS VSS VDD VDD VOUT GND Figure 31. Bandwidth |
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