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ADL8141ACPZN-R7 数据表(PDF) 5 Page - Analog Devices |
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ADL8141ACPZN-R7 数据表(HTML) 5 Page - Analog Devices |
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5 / 22 page ![]() Data Sheet ADL8141 ABSOLUTE MAXIMUM RATINGS analog.com Rev. 0 | 5 of 22 Table 5. Absolute Maximum Ratings Parameter Rating VDD 4 V RF Input Power (RFIN) 20 dBm Pulsed RFIN (Duty Cycle = 10%, Pulse Width = 100 μs) 22 dBm Continuous Power Dissipation (PDISS), TCASE = 85°C (Derate 5.71 mW/°C Above 85°C) 0.51 W Temperature Storage Range −65°C to +150°C Operating Range −40°C to +85°C Quiescent Channel (TCASE = 85°C, VDD = 2 V, IDQ = 25 mA, Input Power (PIN) = Off) 93.75°C Maximum Channel 175°C Stresses at or above those listed under Absolute Maximum Ratings may cause permanent damage to the product. This is a stress rating only; functional operation of the product at these or any other conditions above those indicated in the operational section of this specification is not implied. Operation beyond the maximum operat- ing conditions for extended periods may affect product reliability. THERMAL RESISTANCE Thermal performance is directly linked to printed circuit board (PCB) design and operating environment. Careful attention to PCB thermal design is required. θJC is the channel to case thermal resistance. Table 6. Thermal Resistance Package Type θJC Unit CP-8-30 Quiescent, TCASE = 25°C 141 °C/W Worst Case1, TCASE = 85°C 175 °C/W 1 Worst case across all specified operating conditions. ELECTROSTATIC DISCHARGE (ESD) RATINGS The following ESD information is provided for handling of ESD-sen- sitive devices in an ESD protected area only. Human body model (HBM) per ANSI/ESDA/JEDEC JS-001. ESD Ratings for ADL8141 Table 7. ADL8141, 8-Lead LFCSP ESD Model Withstand Threshold (V) Class HBM ±500 1B ESD CAUTION ESD (electrostatic discharge) sensitive device. Charged devi- ces and circuit boards can discharge without detection. Although this product features patented or proprietary protection circuitry, damage may occur on devices subjected to high energy ESD. Therefore, proper ESD precautions should be taken to avoid performance degradation or loss of functionality. |
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