TC236

680-

× 500-PIXEL CCD IMAGE SENSOR

SOCS043A – JUNE 1994 – REVISED NOVEMBER 1994

11

POST OFFICE BOX 655303

PARAMETER

MIN

TYP†

MAX

UNIT

Dynamic range (see Note 2)

With CDS‡

68

69

70

dB

Dynamic range (see Note 2)

Without CDS‡

57

58

59

dB

Charge conversion factor

20

µV/e

Charge-transfer efficiency (see Note 3)

0.9999

0.99995

1

Signal-response delay time,

τ (see Note 4)

TBD

ns

Gamma (see Note 5)

1

Output resistance

300

400

500

Ω

Noise equivalent signal

With CDS‡

8.5

10

12

electrons

Noise-equivalent signal

Without CDS‡

30

36

42

electrons

ADB (see Note 6)

TBD

Rejection ratio

SRG (see Note 7)

TBD

dB

ABG (see Note 8)

TBD

Supply current

5

10

mA

IAG1, IAG2

2000

Input capacitance Ci

SRG

70

pF

Input capacitance, Ci

RST

10

pF

SAG

4000

† All typical values are at TA = 25°C.

‡ CDS = Correlated double sampling, a signal-processing technique that improves noise performance by subtraction of reset noise.

NOTES:

2. Dynamic range is – 20 times the logarithm of the mean noise signal divided by saturation output signal.

3. Charge-transfer efficiency is one minus the charge loss per transfer in the output register. The test is performed in the dark using

an electrical input signal.

4. Signal-response delay time is the time between the falling edge of the SRG pulse and the output-signal valid state.

5. Gamma (

γ) is the value of the exponent is the equation below for two points on the linear portion of the transfer-function curve (this

value represents points near saturation).

Exposure (2)

Exposure (1)

g

+

Output signal (2)

Output signal (1)

6. ADB rejection ratio is – 20 times the logarithm of the ac amplitude at the output divided b the ac amplitude at ADB.

7. SRG rejection ratio is – 20 times the logarithm of the ac amplitude at the output divided by the ac amplitude at SRG.

8. ABG rejection ratio is – 20 times the logarithm of the ac amplitude at the output divided by the ac amplitude at ABG.