3 (9)

DA6180.001

27 December, 2006

6)

ABSOLUTE MAXIMUM RATINGS

All Voltages with Respect to Ground

Parameter

Symbol

Conditions

Min

Max

Unit

Supply Voltage

- 0.3

5.5

V

Input Voltage

V

ESD Rating

For all pins,

Human Body Model (HBM),

ESD Association Standard

Test Method ESD-STM5.1-

Rs = 1500 Ω),

±2

kV

Latchup Current Limit

For all pins,

test according to

Micro Analog Systems

specification ESQ0141.

See note below.

±100

mA

Operating Temperature

-40

+85

°C

Storage Temperature

- 55

+150

°C

Stresses beyond those listed may cause permanent damage to the device. The device may not operate under these conditions, but it will

not be destroyed.

Note: In latchup testing the supply voltages are connected normally to the tested device. Then pulsed test current is fed to each input

separately and device current consumption is observed. If the device current consumption increases suddenly due to test current pulses

and the abnormally high current consumption continues after test current pulses are cut off then the device has gone to latch up. Current

pulse is turned on for 10 ms and off for 20 ms.

ELECTRICAL CHARACTERISTICS

Operating Conditions: VDD = 1.5V, Temperature = 25°C, unless otherwise specified.

Parameter

Symbol

Conditions

Min

Typ

Max

Unit

Operating Voltage

1.10

3.6

V

Current Consumption

VDD=1.5 V, Vin=0 µVrms

VDD=1.5 V, Vin=20 mVrms

VDD=3.6 V, Vin=0 µVrms

VDD=3.6 V, Vin=20 mVrms

40

24

55

40

58

43

80

65

µ

A

Stand-By Current

See note below.

0.1

µ

A

Input Frequency Range

40

100

kHz

Minimum Input Voltage

0.4

1

µ

Vrms

Maximum Input Voltage

20

mVrms

Receiver Input Resistance

Receiver Input Capacitance

Differential Input,

f=40 kHz..77.5 kHz

600

0.5

kΩ

pF

0.35

V

Output Current

5

µ

A

Output Pulse

20 mVrms

50

140

ms

20 mVrms

150

230

ms

20 mVrms

400

500

600

ms

20 mVrms

700

800

900

ms

Startup Time

Fast Start-up, Vin=0.4 µVrms

Fast Start-up, Vin=20 mVrms

1.3

3.5

s

Output Delay Time

50

100

ms