DAP005 datasheet(8/39 Pages) STMICROELECTRONICS

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Electrical characteristics

DAP005

8/39

Symbol

Parameter

Test condition

Min

Typ

Max

Unit

VINVCLAMP Internal clamp level

IINV = 1 mA

99.5

Voltage gain

Open loop

Gain-bandwidth product

MHz

ICOMP

Source current

VCOMP = 4V, VINV = 2.4 V

-2

-3.5

-5

Sink current

VCOMP = 4V, VINV = 2.6 V

2.5

4.5

VCOMP

Upper clamp voltage

ISOURCE = 0.5 mA

5.7

6.2

6.7

Lower clamp voltage

ISINK = 0.5 mA (2)

2.12.252.4

Current sense comparator

ICS

Input bias current

VCS = 0

-1

µA

tLEB

Leading edge blanking

100

200

300

td(H-L)

Delay to output

120

VCSclamp

Current sense reference

clamp

VCOMP = Upper clamp,

VVFF = VMULT =0.5V

1.0

1.08

1.16

Vcsoffset

Current sense offset

VMULT = 0, VVFF = 3V

VMULT = 3V, VVFF = 3V

VCSdis

Ic latch-off level

(2)

1.63

1.7

1.77

Output overvoltage

IOVP

Dynamic OVP triggering

current

17.5

22.5

µA

Hys

Hysteresis

(4)

µA

Static OVP threshold

(2)

2.15

2.3

Voltage feedforward

VVFF

Linear operation range

RFF=47 kΩ to GND

0.5

∆V

Dropout

VMULTpk-VVFF

Table 5. Electrical characteristics (continued)

( -25°C < TJ < +125°C, VCC = 12V, Co = 1nF between pin GD and GND, CFF =1µF between pin VFF

and GND; unless otherwise specified)

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