LCP152 datasheet(5/11 Pages) STMICROELECTRONICS

部件名	LCP152

功能描述	Programmable transient voltage suppressor for SLIC protection

PDF	11 Pages

Scroll/Zoom	100%

制造商	STMICROELECTRONICS [STMicroelectronics]

网页	http://www.st.com

标志

5 / 11 page

LCP1521S/LCP152DEE

Characteristics

5/11

Figure 3.

Functional Holding Current (IH) test circuit: GO-NO GO test

Figure 4.

Test circuit for VFP and VDGL parameters

Pulse (µs)

(V)

(µF)

(nF)

(µH)

(

Ω)

(

Ω)

(

Ω)

(

Ω)

IPP

(A)

(

Ω)

700

1500

200

501525253010

1.2

1500

761325253010

2500

1.1

1.3

VBAT = - 100V

Surge generator

D.U.T

This is a GO-NO GO test which allows to confirm the holding current (I ) level in a functional test circuit.

- Adjust the current level at the I value by short circuiting the D.U.T.

- Fire the D.U.T. with a surge current: I

= 10A, 10/1000µs

- The D.U.T. will come back to the off-state within a duration of 50ms max.

TEST PROCEDURE:

TIP

RING

GND

R 2

(V is defined in unload condition)

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