PCK2002PDP datasheet(4/8 Pages) PHILIPS

4 / 8 page

Philips Semiconductors

Product data

PCK2002P

140 MHz PCI-X clock buffer

2001 May 09

DC CHARACTERISTICS

TEST CONDITIONS

LIMITS

SYMBOL

PARAMETER

TEST CONDITIONS

Tamb = –40 to +85 °C

UNIT

VDD (V)

OTHER

MIN

MAX

VIH

HIGH level input voltage

3.0 to 3.6

—

2.0

VDD + 0.3

VIL

LOW level input voltage

3.0 to 3.6

—

VSS – 0.3

0.8

3.0 to 3.6

IOH = –1 mA

—

VDD – 0.2

—

VOH

Output HIGH voltage

3.0

IOH = –24 mA

—

2.0

—

3.0

IOH = –12 mA

—

2.4

—

3.0 to 3.6

IOL= 1 mA

—

0.2

VOL

Output LOW voltage

3.0

IOL= 24 mA

—

0.8

3.0

IOL= 12 mA

—

0.55

Output HIGH current

3.0

VOUT = 1 V

—

–50

—

IOH

Output HIGH current

3.3

VOUT = 1.65 V

—

–150

Output LOW current

3.0

VOUT = 2.0 V

—

IOL

Output LOW current

3.3

VOUT = 1.65 V

—

150

±II

Input leakage current

3.6

VI = VDD or GND

—

±5

µA

ICC

Quiescent supply current

3.6

VI = VDD or GND

IO = 0

—

100

µA

PCK2002PDP 数据表(PDF) 4 Page - NXP Semiconductors

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PCK2002PDP 数据表(PDF) 4 Page - NXP Semiconductors

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