Product Specification

SL1 ICS31 01

Rev. 1.2

July 2000

Page 17 of 22

Public

15 Inlet/Label Characterisation and Test

15.1 Characterisation of the Inlet/Label

The parameters recommended to be characterised for the inlet/label are:

Parameter

Symbol

Conditions

Threshold field strength for

UNSELECTED READ command

(standard mode)

UNSELECTED READ command OK

Threshold resonance frequency

No command transmitted to the inlet/label

à

Label generates no response

à No modulation

Threshold field strength for WRITE

command

(standard mode)

WRITE (and Verifying READ) command OK

For more detailed information on inlet /label characterisation please refer to Philips application note

‘I•CODE Label IC, Coil Design Guide’.

15.2 Final Test of the Inlet/Label

Basic flow for production and test:

1. Production of wafer

2. Testing of dies on wafer

3. Writing of serial numbers and pre-configuration

4. Sawing of wafer

5. Assembly of inlets/labels

6. Final test of inlets/labels

7. Writing of customer data

To detect damage of EEPROM cells during production of inlets/labels a final test of the

EEPROM after assembly of the inlet/label is recommended. This is necessary to achieve

lowest failure rates.