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PS810 数据表(PDF) 7 Page - Microchip Technology |
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PS810 数据表(HTML) 7 Page - Microchip Technology |
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7 / 46 page ![]() © 2006 Microchip Technology Inc. DS21904C-page 7 PS810 3.0 OPERATIONAL DESCRIPTION 3.1 A/D Operation The PS810 A/D converter measures current, voltage and temperature and integrates the current over time to calculate State-Of-Charge. Cell voltage is measured with a direct connection to the battery cell without requiring an external voltage divider. Using an external sense resistor, current is monitored during both charge and discharge and is integrated over time using the on- chip oscillator as the time base. Temperature is measured from the on-chip temperature sensor or an optional external thermistor. Voltage, current and temperature can be calibrated for accuracy over the operational range. The A/D converter performs sampling using a 32 kHz clock. 3.1.1 CURRENT MEASUREMENT The A/D input channels for current measurement are the SR and GND pins. The voltage drop across the sense resistor is measured and converted mathematically into a current measurement. The current is also integrated over time to get the amount of charge entering or leaving the battery. A sense resistor is connected to SR and GND. The maximum input voltage that can be measured at SR is +/-150 mV. The sense resistor should be properly sized to accommodate the lowest and highest expected charge and discharge currents, including suspend and/ or standby currents. The parameter NullCurr represents the zero-zone current of the battery. This is provided as a calibration guardband for reading zero current. Currents below +/- NullCurr (in mA) limit are read as zero and not included in the capacity algorithm calculations. A typical value for NullCurr is 3 mA, therefore, currents between -3 mA and +3 mA will be reported as zero and not included in the capacity calculations. This feature is provided so that electrical noise on the battery module current path is not interpreted as actual charge entering or leaving the battery. 3.1.1.1 Sense Resistor Selection and Current Measurement Range The current resolution is based on the smallest amount of voltage the A/D converter can measure across the sense resistor. Since this measurement uses 13 bits (plus sign) and the reference used is the internal 150 mV reference, the smallest voltage across the sense resistor that can be measured is: EQUATION 3-1: 3.1.1.2 Current Calibration In-circuit calibration of the current is done using the communication interface (SMBus/I2C or SPS) at time of manufacture to obtain optimal accuracy. A correction is calculated and stored for both offset and slope. COD is a constant that is measured at calibration time and contains the offset due to external PCB components. CFCurr is the “Correction Factor for Current” which compensates the A/D gain and any variances in the actual sense resistance over varying currents. It is multiplied against the raw A/D measurement. COCurr is the “Correction Offset for Current” which is updated in real time by the A/D shorting the inputs and comparing any result to zero. This is added to COD and compensates for any offset that varies over time, such as temperature dependent offsets. Figure 3-1 shows the relationship of the COCurr and CFCurr values. 150 mV/(2 ^ 13 – 1) = 150 mV/32767 = 18.3 μV Thus, the smallest current that can be measured is: 18.3 μV/RSENSE (mΩ) The largest current that can be measured is: 150 mV/RSENSE (m Ω) Example: a 20 milliohm sense resistor will measure from: 18.3 μV/20 mΩ = 0.915 mA (though will be recorded as zero if < NullCurr) up to: 150 mV/20 m Ω = 7.5 Amps |
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