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LP5527TL 数据表(PDF) 18 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
部件名 LP5527TL
功能描述  Tiny LED Driver for Camera Flash and 4 LEDs with I2C Programmability, Connectivity Test and Audio Synchronization
PDF  21 Pages
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制造商  NSC [National Semiconductor (TI)]
网页  http://www.national.com
标志 NSC - National Semiconductor (TI)

LP5527TL 数据表(HTML) 18 Page - National Semiconductor (TI)

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Test Interface (Continued)
20184020
Test Interface Timing Diagram
Test Interface Timing Parameters
Symbol
Condition
Parameter
Limit
Units
Min
Max
1V
DD1,2 = 4.2V
Setup Time after V
DD1,2 = 4.2V
1
ms
2
Clock High Time
200
µs
3
Clock Low Time
200
µs
4
Test Result Settling Time
10
µs
5
Data Hold Time
0
10
ns
NOTE: Data guaranteed by design
Test Interface Characteristics
Limits in standard typeface are for T
J =25
oC.
Symbol
Parameter
Condition
Min
Typ
Max
Units
Logic Input T1
V
IL
Input Low Level
V
DD1,2 = 4.2V
0.5
V
V
IH
Input High Level
1.2
V
Logic Output T2
V
OL
Output Low Level
V
DD1,2 = 4.2V, IOUT =3mA
(pull-up current)
0.3
0.5
V
V
OH
Output High Level
V
DD1,2 =4.2V, IOUT =-3mA
(pull-down current)
V
DD1,2 - 0,5
3.9
V
Internal Current Sink
I
SINK
Sink Current
V
DD1,2 = 4.2V
500
µA
Connectivity Test Pass Range
V
PASS1
Voltage Over the Internal
Current Sink; Low Level
Production test cases
V
DD1,2 = 4.2V
V
OUT = 3.9V to 4.2V
0.05
-50
0.10
0.16
+60
V
%
V
PASS2
Voltage Over the Internal
Current Sink; High Level
2.03
-30
2.90
3.77
+30
V
%
V
PASS3
Voltage Over the Internal
Current Sink; Low Level
Field test cases
V
DD1,2 = 3.0V...4.2V
V
OUT = 5.0V ± 5%
-30%
0.40
+30%
V
V
PASS4
Voltage Over the Internal
Current Sink; High Level
-10%
3.95
+10%
V
NOTE: Data guaranteed by design
www.national.com
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