ST7GEME4

Electrical characteristics

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4.7

EMC characteristics

Susceptibility tests are performed on a sample basis during product characterization.

4.7.1

Functional EMS (electromagnetic susceptibility)

Based on a simple running application on the product (toggling 2 LEDs through I/O ports),

the product is stressed by two electromagnetic events until a failure occurs (indicated by the

LEDs).

●

ESD: electrostatic discharge (positive and negative) is applied on all pins of the device

until a functional disturbance occurs. This test conforms with the IEC 1000-4-2

standard.

●

through a 100 pF capacitor, until a functional disturbance occurs. This test conforms

with the IEC 1000-4-4 standard.

A device reset allows normal operations to be resumed. The test results are given in the

table below based on the EMS levels and classes defined in application note AN1709.

Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical

application environment and simplified MCU software. It should be noted that good EMC

performance is highly dependent on the user application and the software in particular.

Therefore it is recommended that the user applies EMC software optimization and

prequalification tests in relation with the EMC level requested for his application.

Output high to low fall time(1)

-

0.8

µs

Output low to high rise time(1)

-

0.8

µs

Short-circuit to ground(1)

15

mA

Smartcard RST C4 and C8 Pin

Output low Level Voltage

I = -0.5 mA

-

-

0.4 (3)

V

Output high level voltage

I = 20

µAV

(3)

(3)

V

Output high to low fall time(1)

-

0.8

µs

Output low to high rise time(1)

-

0.8

µs

Short-circuit to ground(1)

15

mA

1.

Guaranteed by design.

2.

and CPU in WFI mode.

3.

Data based on characterization results, not tested in production.

Table 18.

Smartcard supply supervisor characteristics (continued)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit