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ACT4530M 数据表(PDF) 3 Page - Qorvo, Inc

部件名 ACT4530M
功能描述  40 V/3.0 A CV/CC Buck Converter Featuring QC2.0, USB Auto-Detect and USB-PD
PDF  15 Pages
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制造商  QORVO [Qorvo, Inc]
网页  https://www.qorvo.com/
标志 QORVO - Qorvo, Inc

ACT4530M 数据表(HTML) 3 Page - Qorvo, Inc

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Data Sheet Rev. B, September 2019 | Subject to change without notice
3 of 15
www.qorvo.com
© 2020 Qorvo US, Inc. All rights reserved.
ACT4530M
40 V/3.0 A CV/CC Buck Converter Featuring QC2.0, USB Auto-Detect and USB-PD
PIN DESCRIPTIONS
PIN
NAME
DESCRIPTION
1
CSP
Voltage Feedback Input. Connect to node of the inductor and output capacitor. CSP and CSN Kevin
sense is recommended.
2
CSN
Negative input terminal of output current sense. Connect to the negative terminal of current
sense resistor.
3
PDC
USB-PD Control Pin. When PDC is floating, VOUT = 5.1 V. When PDC is pulled low, VOUT = 9.1 V. When
PDC is pulled high, the IC ignores the PDC pin and the output voltage does not change from the
previous setting.
4
DP
Data Line Positive Input. Connected to D+ of attached portable device data line. This pin passes 8 kV
HBM ESD.
5
DM
Data Line Negative Input. Connected to D- of attached portable device data line. This pin passes 8 kV
HBM ESD.
6
IN
Power Supply Input. Bypass this pin with a 10 μF ceramic capacitor to GND, placed as close to the IC
as possible.
7
SW
Power Switching Output to External Inductor.
8
HSB
High Side Bias Pin. This provides power to the internal high-side MOSFET gate driver. Connect a
22 nF capacitor from HSB pin to SW pin.
9
GND
Ground and Heat Dissipation Pad. Connect this exposed pad to large ground copper area with copper
and vias.
ABSOLUTE MAXIMUM RATINGS
PARAMETER
VALUE
UNIT
IN to GND
-0.3 to 40
V
SW to GND
-1 to VIN +1
V
HSB to GND
VSW - 0.3 to VSW + 7
V
CSP, CSN to GND
-0.3 to +15
V
PDC to GND
-0.3 to +6
V
All other pins to GND
-0.3 to +6
V
Junction to Ambient Thermal Resistance
46
°C/W
Operating Junction Temperature
-40 to 150
°C
Storage Junction Temperature
-55 to 150
°C
Lead Temperature (Soldering 10 sec.)
300
°C
: Do not exceed these limits to prevent damage to the device. Exposure to absolute maximum rating conditions for long periods may affect
device reliability.



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