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LMP2012QML 数据表(PDF) 2 Page - Texas Instruments

部件名 LMP2012QML
功能描述  LMP2012QML Dual High Precision, Rail-to-Rail Output Operational Amplifier
PDF  13 Pages
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制造商  TI2 [Texas Instruments]
网页  https://www.ti.com
标志 TI2 - Texas Instruments

LMP2012QML 数据表(HTML) 2 Page - Texas Instruments

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LMP2012QML
SNOSAU5H – MARCH 2007 – REVISED APRIL 2013
www.ti.com
Absolute Maximum Ratings
(1)
Supply Voltage
5.8V
Differential Input Voltage
±Supply Voltage
Power Dissipation(2)
714mW
Maximum Junction Temperature (TJmax)
150°C
Common-Mode Input Voltage
-0.3
≤ VCM ≤ VCC +0.3V
Current at Input Pin
30 mA
Current at Output Pin
30 mA
Current at Power Supply Pin
50 mA
Operating Temperature Range
-55°C to +125°C
Storage Temperature Range
-55°C to +150°C
CLGA Lead Temperature (soldering 10 sec.)
+260°C
Thermal Resistance
θJA
CLGA (Still Air)
175°C/W
CLGA (500LF/Min Air Flow)
115°C/W
θJC
CLGA
12.3°C/W
Package Weight
CLGA
220mg
ESD Tolerance(3)
4000V
(1)
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for
which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the
Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may
degrade when the device is not operated under the listed test conditions.
(2)
The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature),
θJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any
temperature is PDmax = (TJmax - TA)/θJA or the number given in the Absolute Maximum Ratings, whichever is lower.
(3)
Human body model, 1.5 k
Ω in series with 100 pF.
Quality Conformance Inspection
Table 1. Mil-Std-883, Method 5005 - Group A
Subgroup
Description
Temp (°C)
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
12
Setting time at
+25
13
Setting time at
+125
14
Setting time at
-55
2
Submit Documentation Feedback
Copyright © 2007–2013, Texas Instruments Incorporated
Product Folder Links: LMP2012QML



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