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STM32F429NET6TR 数据表(PDF) 128 Page - STMicroelectronics |
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STM32F429NET6TR 数据表(HTML) 128 Page - STMicroelectronics |
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128 / 231 page ![]() Electrical characteristics STM32F427xx STM32F429xx 128/231 DocID024030 Rev 6 tBE Bank erase time Program/erase parallelism (PSIZE) = x 8 -16 32 s Program/erase parallelism (PSIZE) = x 16 -11 22 Program/erase parallelism (PSIZE) = x 32 -8 16 Vprog Programming voltage 32-bit program operation 2.7 - 3.6 V 16-bit program operation 2.1 - 3.6 V 8-bit program operation 1.7 - 3.6 V 1. Guaranteed by characterization results. 2. The maximum programming time is measured after 100K erase operations. Table 49. Flash memory programming with VPP Symbol Parameter Conditions Min(1) Typ Max(1) 1. Guaranteed by design. Unit tprog Double word programming TA = 0 to +40 °C VDD = 3.3 V VPP = 8.5 V -16 100(2) 2. The maximum programming time is measured after 100K erase operations. µs tERASE16KB Sector (16 KB) erase time - 230 - ms tERASE64KB Sector (64 KB) erase time - 490 - tERASE128KB Sector (128 KB) erase time - 875 - tME Mass erase time - 6.9 - s tBE Bank erase time - 6.9 - s Vprog Programming voltage 2.7 - 3.6 V VPP VPP voltage range 7 - 9 V IPP Minimum current sunk on the VPP pin 10 - - mA tVPP(3) 3. VPP should only be connected during programming/erasing. Cumulative time during which VPP is applied -- 1 hour Table 48. Flash memory programming (continued) Symbol Parameter Conditions Min(1) Typ Max(1) Unit |
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