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STM32MP151AAB3T 数据表(PDF) 158 Page - STMicroelectronics

部件名 STM32MP151AAB3T
功能描述  Arm® Cortex®-A7 650 MHz Cortex®-M4 MPU, TFT, 35 comm. interfaces, 25 timers, adv. analog
PDF  245 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

STM32MP151AAB3T 数据表(HTML) 158 Page - STMicroelectronics

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Electrical characteristics
STM32MP151A
158/245
DS12500 Rev 1
Functional EMS (electromagnetic susceptibility)
While a simple application is executed on the device (toggling 2 LEDs through I/O ports).
the device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
FTB: a burst of fast transient voltage (positive and negative) is applied to VDD and VSS
through a 100 pF capacitor, until a functional disturbance occurs. This test is compliant
with the IEC 61000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in Table 43. They are based on the EMS levels and classes
defined in application note AN1709 available from the ST website www.st.com.
As a consequence, it is recommended to add a serial resistor (1 kΩ) located as close as
possible to the MCU to the pins exposed to noise (connected to tracks longer than 50 mm
on PCB).
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
Corrupted program counter
Unexpected reset
Critical Data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
Table 43. EMS characteristics
Symbol
Parameter
Conditions
Level/
Class
VFESD
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
VDD = 3.3 V, VDDCORE =
1.2 V, TA = +25 °C,
LFBGA448,
Fmpuss_ck = 648 MHz,
Fmcu_ck = 209 MHz, M4
core not running,
conforms to IEC 61000-4-
2
2B
VFTB
Fast transient voltage burst limits to be applied
through 100 pF on VDD and VSS pins to induce a
functional disturbance
5A



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