0402B0R5B datasheet(22/29 Pages) MULTICOMP

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Page <22>

V1.0

08/05/25

General Purpose Multilayer Ceramic Capacitors

4 to 100V (NP0, X7R, Y5V, X6S, X7S & X5R Dielectrics)

Newark.com/multicomp-pro

Farnell.com/multicomp-pro

sg.element14.com/b/multicomp-pro

Item

Test Condition

Requirements

Solderability * Solder temperature: 235±5°C

* Dipping time: 2±0.5 sec.

95% min. coverage of all metalized area.

10 Bending Test

* The middle part of substrate shall be

pressurized by means of the

pressurizing rod at a rate of about

1mm per second until the deflection

becomes 1mm and then the pressure

shall be maintained for 5±1 sec.

*Before initial measurement (Class II

only):

To apply de-aging at 150°C for 1hr then

set for 24±2 hrs at room temp.

* Measurement to be made after

keeping at room temp. for 24±2 hrs.

* No remarkable damage.

* Cap change:

NP0: within ±5% or 0.5pF whichever is larger

X7R, X5R, X6S, X7S: within ±12.5%

(This capacitance change means the change of capacitance

under specified flexure of substrate from the capacitance

measured before the test.)

Resistance

to Soldering

Heat

* Solder temperature: 260±5°C

* Dipping time: 10±1sec

* Preheating: 120 to 150°C for 1 minute

before immerse the capacitor in a

eutectic solder.

*Before initial measurement (Class

II only): To apply de-aging at 150°C

for 1hr then set for 24±2 hrs at room

temp.

*Cap. / DF(Q) / I.R. Measurement to be

made after de-aging at 150°C for 1hr

then set for 24±2 hrs at room temp.

* No remarkable damage.

* Cap change:

NP0: within ±2.5% or 0.25pF whichever is larger

X7R, X5R, X6S, X7S: within ±7.5%

* Q/D.F., I.R. and dielectric strength: To meet initial require-

ments.

* 25% max. leaching on each edge.

12 Temperature

Cycle

* Conduct the five cycles according to

the temperatures and time.

Step

Temp. (°C)

Time

(min.)

Min. operating temp. +0/-3

30±3

Room temp.

2~3

Max. operating temp. +3/-0 30±3

Room temp.

2~3

*Before initial measurement (Class II

only): To apply de-aging at 150°C for

1hr then set for 24±2 hrs at room

temp.

* Cap. / DF(Q) / I.R. Measurement to

be made after de-aging at 150°C for

1hr then set for 24±2 hrs at room

temp.

* No remarkable damage.

* Cap change:

NP0: within ±2.5% or 0.25pF whichever is larger

X7R, X5R, X6S, X7S: within ±7.5%

* Q/D.F., I.R. and dielectric strength: To meet initial require-

ments.

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