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AMC7832IPAPRG4.B 数据表(PDF) 6 Page - Texas Instruments |
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AMC7832IPAPRG4.B 数据表(HTML) 6 Page - Texas Instruments |
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6 / 74 page ![]() AMC7832 SLAS836 – MARCH 2014 www.ti.com 7 Specifications 7.1 Absolute Maximum Ratings over operating free-air temperature range (unless otherwise noted) (1) MIN MAX UNIT AVDD to GND -0.3 +6 V DVDD to GND -0.3 +6 V IOVDD to GND -0.3 DVDD V AVCC to GND -0.3 +18 V Supply voltage range AVEE to GND -13 +0.3 V AVSSA,B,C,D to AVEE -0.3 +13 V AVCC to AVSSA,B,C,D -0.3 +26 V AVCC to AVEE -0.3 +26 V DGND to AGND -0.3 +0.3 V ADC_[0-11] analog input voltage to GND –13 +13 V ADC_[0-11] analog input current -10 +10 mA LV_ADC[12-16] analog input voltage to GND -0.3 AVDD + 0.3 V LV_ADC[12-16] analog input current -10 +10 mA DAC outputs to GND AVSS - 0.3 AVCC + 0.3 V REF_CMP to GND -0.3 AVDD + 0.3 V Terminal voltage/ Current range REF_OUT[1-2] to GND -0.3 AVDD + 0.3 V VRANGE[A-D] to GND -0.3 AVDD + 0.3 V CS, SCLK, SDI and RESET to GND -0.3 IOVDD + 0.3 V SDO to GND -0.3 IOVDD + 0.3 V GPIO[0-7] to GND -0.3 IOVDD + 0.3 V GPIO[0-7] sinking current 5 mA Operating temperature range -40 +125 °C Junction temperature range (TJ max) -40 +150 °C (1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 7.2 Handling Ratings PARAMETER DEFINITION MIN MAX UNIT Tstg Storage temperature range -40 +150 °C Human body model (HBM) ESD stress voltage(2) 2.0 kV VESD (1) Charged device model (CDM) ESD stress voltage(3) 750 V (1) Electrostatic discharge (ESD) to measure device sensitivity and immunity to damage caused by assembly line electrostatic discharges in to the device. (2) Level listed above is the passing level per ANSI, ESDA, and JEDEC JS-001. JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (3) Level listed above is the passing level per EIA-JEDEC JESD22-C101. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6 Submit Documentation Feedback Copyright © 2014, Texas Instruments Incorporated Product Folder Links: AMC7832 |
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