MICROMODULES

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RELIABILITY

Product

qualification

and

on-going

reliability

monitoring is performed by ST. The principal steps

are listed in Table 8 and Table 9.

Table 8. Package Related Tests

Note: 1. The notation

m/n means: reject the whole lot if more than m devices fail from a sample of n devices. For instance, 0/45 means a

sample of 45 devices taken from a lot, with the whole lot only accepted if every one of the 45 sample devices passed the test.

Table 9. Product Related Tests

Test

Description

Method

Condit ion

LPTD

Criteria

(note 1)

1

Geometry

ST Specification

Monitoring/Lot

5

0/45

2

Visual inspection

ST Specification

Outgoing/Lot

AQL= 0.040

0/315

3

Temperature cycling

MIL-STD-883

Method 1010

-40

°Cto 150 °C, 100 cycles

5

0/45

4

Salt atmosphere

corrosion of contacts

MIL-STD-883

Method 1009

35

°C, 5% NaCl, 24 hour

15

0/15

5

Moisture resistance

MIL-STD-883

Method 1004

85

°C, 85% HR Biased 5.5 V,

168 hour

7

0/32

6

Vibration with electrical

measurement

ISO/IEC 10373

1 octave/minute, acceleration up to

10 G (repeated 20 times)

measurement memory check at 25

°C

20

0/11

7

Bending properties

ISO/IEC 7816-1

Long side: deflection 2 cm

Short side: deflection 1 cm

30 bendings per minute

20

0/11

8

Torsion properties

ISO/IEC 7816-1

Maximum displacement 15

°±1°

1000 torsions, 30 torsions per minute

applied on long side only

20

0/11

Test

Description

Method

Condit ion

LPTD

Criteria

1

Life test

MIL-STD-883

Method 1005

140

°C, 6 V, 504 hours measurement

memory check at 25

°C

3

0/76

2

Electrostatic discharge

MIL-STD-883

Method 3015

Human body model:

1.5 k

Ω, 100 pF, ± 5000 V

n/a

0/9

Electrostatic discharge

MIL-STD-883

Method 3015

Machine model: 0

Ω, 200 pF, ± 200 V

measurement memory check at 25

°C

n/a

0/9

3

Data retention,

Temperature storage

MIL-STD-883

Method 1005

150

°C, 1000 hours, no bias

measurement memory check at 25

°C

5

0/45

4

Write/Erase cycles

ST Specification

100,000 Cycles

200 ppm/

1024 byte/

1000 cycle

0/32

5

Magnetic field, memory

check

ISO IEC 10373

79,500 A/m

15

1/25

6

X-rays, memory check

ISO IEC 10373

70 kV, 0.1 Grey

15

1/25

7

UV light, memory check

ISO IEC 10373

15

1/25