11 Device and Documentation Support

11.1 Documentation Support

11.1.1 Related Documentation

For related documentation see the following:

• Texas Instruments, Digital Isolator Design Guide application report

• Texas Instruments, How to use isolation to improve ESD, EFT and Surge immunity in industrial systems

application report

• Texas Instruments, Isolation Glossary

• Texas Instruments, TMS320F2803xPiccolo™ Microcontrollers data sheet

• Texas Instruments, ADS79xx 12/10/8-Bit, 1 MSPS, 16/12/8/4-Channel, Single-Ended, MicroPower, Serial

Interface ADCs data sheet

• Texas Instruments, REF50xx Low-Noise, Very Low Drift, Precision Voltage Reference data sheet

• Texas Instruments, SN6501 Transformer Driver for Isolated Power Supplies data sheet

• Texas Instruments, SN65HVD23x 3.3-V CAN Bus Transceivers data sheet

• Texas Instruments, TPS76333 Low-Power 150-mA Low-Dropout Linear Regulators data sheet

11.2 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper

right corner, click on Alert me to register and receive a weekly digest of any product information that has

changed. For change details, review the revision history included in any revised document.

11.3 Community Resources

11.4 Trademarks

Piccolo™ is a trademark of Texas Instruments.

All trademarks are the property of their respective owners.

12 Revision History

NOTE: Page numbers for previous revisions may differ from page numbers in the current version.

Changes from Revision G (June 2023) to Revision H (January 2024)

Page

• Updated numbering format for tables, figures and cross-references throughout document.............................. 1

• Updated Thermal Characteristics, Safety Limiting Values, and Thermal Derating Curves to provide more

accurate system-level thermal calculations........................................................................................................ 6

• Updated electrical and switching characteristics to match device performance.................................................6

Changes from Revision F (November 2022) to Revision G (June 2023)

Page

• Changed standard name From: "DIN V VDE V 0884-11:2017-01" To: "DIN EN IEC 60747-17 (VDE 0884-17)"

throughout the document....................................................................................................................................1

• Removed references to standard IEC/EN/CSA 60950-1 throughout the document...........................................1

• Removed standard revision and year references from all standard names throughout the document.............. 1

• Added Maximum impulse voltage (VIMP) per DIN EN IEC 60747-17 (VDE 0884-17) ....................................... 9

• Changed test conditions and values of Maximum surge isolation voltage (VIOSM) specification per DIN EN IEC

60747-17 (VDE 0884-17) .................................................................................................................................. 9

• Clarified method b test conditions of Apparent charge (qPD) .............................................................................9

• Changed maximum working voltage value From: 250 VRMS To: 400 VRMS for DBQ-16 devices per GB

4943.1............................................................................................................................................................... 11

• Changed working voltage lifetime margin from: 87.5% to: 50%, minimum required insulation lifetime from:

37.5 years to: 30 years and insulation lifetime per TDDB from: 135 years to: 169 years per DIN EN IEC

60747-17 (VDE 0884-17)................................................................................................................................. 33

• Changed Figure 8-7 per DIN EN IEC 60747-17 (VDE 0884-17)......................................................................33

ISO7760, ISO7761, ISO7762, ISO7763

SLLSER1H – AUGUST 2017 – REVISED JANUARY 2024

www.ti.com

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