If Military/Aerospace specified devices are required,

please contact the National Semiconductor Sales Office/

Distributors for availability and specifications.

Supply Voltage

+35V to −0.2V

Output Voltage

+6V to −1.0V

Output Current

10 mA

Storage Temperature,

TO-46 Package

−76˚F to +356˚F

TO-92 Package

−76˚F to +300˚F

SO-8 Package

−65˚C to +150˚C

ESD Susceptibility (Note 12)

800V

Lead Temp.

TO-46 Package

(Soldering, 10 seconds)

+300˚C

TO-92 Package

(Soldering, 10 seconds)

+260˚C

SO Package (Note 13)

Vapor Phase (60 seconds)

215˚C

Infrared (15 seconds)

220˚C

Specified Operating Temp. Range (Note 3)

T

LM34, LM34A

−50˚F to +300˚F

LM34C, LM34CA

−40˚F to +230˚F

LM34D

+32˚F to +212˚F

LM34A

LM34CA

Parameter

Conditions

Tested

Design

Tested

Design

Units

Typical

Limit

Limit

Typical

Limit

Limit

(Max)

(Note 5)

(Note 6)

(Note 5)

(Note 6)

Accuracy (Note 8)

T

˚F

T

˚F

T

˚F

T

˚F

Nonlinearity (Note 9)

T

˚F

Sensor Gain

T

+10.0

+9.9,

+10.0

+9.9,

mV/˚F, min

(Average Slope)

+10.1

+10.1

mV/˚F, max

Load Regulation

T

mV/mA

(Note 4)

T

mV/mA

0

≤ I

Line Regulation

T

mV/V

(Note 4)

5V

≤ V

mV/V

Quiescent Current

V

75

90

75

90

µA

(Note 10)

V

131

160

116

139

µA

V

76

92

76

92

µA

V

132

163

117

142

µA

Change of Quiescent

4V

≤ V

+0.5

2.0

0.5

2.0

µA

Current (Note 4)

5V

≤ V

+1.0

3.0

1.0

3.0

µA

Temperature Coefficient

+0.30

+0.5

+0.30

+0.5

µA/˚F

of Quiescent Current

Minimum Temperature

In circuit of

Figure 1,

+3.0

+5.0

+3.0

+5.0

˚F

for Rated Accuracy

I

Long-Term Stability

T

for 1000 hours

˚F

Note 2: Unless otherwise noted, these specifications apply: −50˚F

+32˚F

Note 3: Thermal resistance of the TO-46 package is 720˚F/W junction to ambient and 43˚F/W junction to case. Thermal resistance of the TO-92 package is 324˚F/W

junction to ambient. Thermal resistance of the small outline molded package is 400˚F/W junction to ambient. For additional thermal resistance information see table

in the Typical Applications section.

Note 4: Regulation is measured at constant junction temperature using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed

by multiplying the internal dissipation by the thermal resistance.

Note 5: Tested limits are guaranteed and 100% tested in production.

Note 6: Design limits are guaranteed (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to

calculate outgoing quality levels.

Note 7: Specification in BOLDFACE TYPE apply over the full rated temperature range.

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