Note 8: Accuracy is defined as the error between the output voltage and 10 mV/˚F times the device’s case temperature at specified conditions of voltage, current,

and temperature (expressed in ˚F).

Note 9: Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the device’s rated temperature

range.

Note 10: Quiescent current is defined in the circuit of

Note 11: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating

the device beyond its rated operating conditions (Note 2).

Note 12: Human body model, 100 pF discharged through a 1.5 k

Ω resistor.

Note 13: See AN-450 “Surface Mounting Methods and Their Effect on Product Reliability” or the section titled “Surface Mount” found in a current National

Semiconductor Linear Data Book for other methods of soldering surface mount devices.

LM34

LM34C, LM34D

Parameter

Conditions

Tested

Design

Tested

Design

Units

Typical

Limit

Limit

Typical

Limit

Limit

(Max)

(Note 5)

(Note 6)

(Note 5)

(Note 6)

Accuracy, LM34, LM34C

T

˚F

(Note 8)

T

˚F

T

˚F

T

˚F

Accuracy, LM34D

T

˚F

(Note 8)

T

˚F

T

˚F

Nonlinearity (Note 9)

T

˚F

Sensor Gain

T

+10.0

+9.8,

+10.0

+9.8,

mV/˚F, min

(Average Slope)

+10.2

+10.2

mV/˚F, max

Load Regulation

T

mV/mA

(Note 4)

T

mV/mA

0

≤ I

Line Regulation

T

mV/V

(Note 4)

5V

≤ V

mV/V

Quiescent Current

V

75

100

75

100

µA

(Note 10)

V

131

176

116

154

µA

V

76

103

76

103

µA

V

132

181

117

159

µA

Change of Quiescent

4V

≤ V

+0.5

3.0

0.5

3.0

µA

Current (Note 4)

5V

≤ V

+1.0

5.0

1.0

5.0

µA

Temperature Coefficient

+0.30

+0.7

+0.30

+0.7

µA/˚F

of Quiescent Current

Minimum Temperature

In circuit of

Figure 1,

+3.0

+5.0

+3.0

+5.0

˚F

for Rated Accuracy

I

Long-Term Stability

T

for 1000 hours

˚F

www.national.com

4