LCP150S datasheet(4/6 Pages) STMICROELECTRONICS

部件名	LCP150S

功能描述	PROGRAMMABLE TRANSIENT VOLTAGE SUPPRESSOR FOR SLIC PROTECTION

PDF	6 Pages

Scroll/Zoom	100%

制造商	STMICROELECTRONICS [STMicroelectronics]

网页	http://www.st.com

标志

4 / 6 page

FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT = GO - NOGO TEST.

-Vpp

Vbat = - 48V

Ipp = 10A,10/1000 s

VSGL

This is a GO-NOGO Test which allows to confirm the holding current (IH) level in a functional

test circuit.

This test can be performedif the reference test circuit can’t be implemented.

TEST PROCEDURE :

1) Adjust the current level at the IH value by short circuiting the AK of the D.U.T.

2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000

µs.

3) The D.U.T will come back to the OFF-State within a duration of 50 ms max.

The VSGL is measured just before firing

1E-2

1E-1

1E+0

1E+1

1E+2

1E+3

(A)

TSM

t(s)

Tj initial = 25

°C

Fig. 1 : Surge peak current versus overload

duration (typical values).

LCP150S

4/6

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