M25P40 datasheet(32/40 Pages) STMICROELECTRONICS

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M25P40

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Table 17. AC Characteristics (25MHz Operation, Device Grade 6 or 3)

Note: 1. tCH + tCL must be greater than or equal to 1/ fC

2. Value guaranteed by characterization, not 100% tested in production.

3. Expressed as a slew-rate.

4. Only applicable as a constraint for a WRSR instruction when SRWD is set at 1.

5. For device grade 3, this is Preliminary Data

Test conditions specified in Table 9. and Table 16.

Symbol

Alt.

Parameter

Min.5

Typ.

Max.5

Unit

Clock Frequency for the following instructions:

FAST_READ, PP, SE, BE, DP, RES,

WREN, WRDI, RDSR, WRSR

D.C.

MHz

Clock Frequency for READ instructions

D.C.

MHz

tCH

tCLH

Clock High Time

tCL

tCLL

Clock Low Time

tCLCH

Clock Rise Time3 (peak to peak)

0.1

V/ns

tCHCL

Clock Fall Time3 (peak to peak)

0.1

V/ns

tSLCH

tCSS

S Active Setup Time (relative to C)

tCHSL

S Not Active Hold Time (relative to C)

tDVCH

tDSU

Data In Setup Time

tCHDX

tDH

Data In Hold Time

tCHSH

S Active Hold Time (relative to C)

tSHCH

S Not Active Setup Time (relative to C)

tSHSL

tCSH

S Deselect Time

100

tSHQZ

tDIS

Output Disable Time

tCLQV

Clock Low to Output Valid

tCLQX

tHO

Output Hold Time

tHLCH

HOLD Setup Time (relative to C)

tCHHH

HOLD Hold Time (relative to C)

tHHCH

HOLD Setup Time (relative to C)

tCHHL

HOLD Hold Time (relative to C)

tHHQX

tLZ

HOLD to Output Low-Z

tHLQZ

tHZ

HOLD to Output High-Z

tWHSL

Write Protect Setup Time

tSHWL

Write Protect Hold Time

100

tDP

S High to Deep Power-down Mode

µs

tRES1

S High to Standby Mode without Electronic

Signature Read

µs

tRES2

S High to Standby Mode with Electronic

Signature Read

1.8

µs

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