M2716 datasheet(4/9 Pages) STMICROELECTRONICS

4 / 9 page

AI00827

2.4V

0.45V

2.0V

0.8V

Figure 3. AC Testing Input Output Waveforms

Input Rise and Fall Times

≤ 20ns

Input Pulse Voltages

0.45V to 2.4V

Input and Output Timing Ref. Voltages

0.8V to 2.0V

AC MEASUREMENT CONDITIONS

AI00828

1.3V

OUT

CL = 100pF

CL includes JIG capacitance

3.3k

Ω

1N914

DEVICE

UNDER

TEST

Figure 4. AC Testing Load Circuit

Note that Output Hi-Z is defined as the point where data

is no longer driven.

Symbol

Parameter

Test Condition

Min

Max

Unit

CIN

Input Capacitance

VIN = 0V

COUT

Output Capacitance

VOUT = 0V

Note: 1. Sampled only, not 100% tested.

Table 4. Capacitance (1) (TA = 25

°C, f = 1 MHz )

Symbol

Parameter

Test Condition

Min

Max

Unit

ILI

Input Leakage Current

≤ VIN ≤ VCC

±10

µA

ILO

Output Leakage Current

VOUT = VCC, EP = VCC

±10

µA

ICC

Supply Current

EP = VIL, G = VIL

100

ICC1

Supply Current (Standby)

EP = VIH, G = VIL

IPP

Program Current

VPP = VCC

5mA

VIL

Input Low Voltage

–0.1

0.8

VIH

Input High Voltage

VCC + 1

VOL

Output Low Voltage

IOL = 2.1mA

0.45

VOH

Output High Voltage

IOH = –400

µA

2.4

Note: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP.

Table 5. Read Mode DC Characteristics (1)

(TA = 0 to 70

°C or –40 to 85 °C; VCC = 5V ± 5% or 5V ± 10%; VPP = VCC)

4/9

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