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AP40N20MP 数据表(PDF) 2 Page - A POWER MICROELECTRONICS |
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AP40N20MP 数据表(HTML) 2 Page - A POWER MICROELECTRONICS |
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2 / 6 page ![]() AP40N20MP 200V N-Channel Enhancement Mode MOSFET AP40N20MP Rev1.0 臺灣永源微電子科技有限公司 Electrical Characteristics Diagrams Symbol Parameter Tests conditions Min Typ Max Units BVDSS Drain-Source Voltage ID=250μA, VGS=0V 200 - - V ΔBVDSS /ΔTJ Breakdown Voltage Temperature Coefficient ID=250μA, referenced to 25 ℃ - 0.19 - V/ ℃ IDSS Zero Gate Voltage Drain Current VDS=200V, VGS=0V, TC=25℃ - - 1 μA IGSSF Gate-body leakage current, forward VDS=0V, VGS =30V - - 100 nA IGSSR Gate-body leakage current, reverse VDS=0V, VGS =-30V - - -100 nA VGS(th) Gate Threshold Voltage VDS = VGS , ID=250μA 2.0 - 4.0 V RDS(ON) Static Drain-Source On-Resistance VGS =10V , ID=14.0A - 60 80 mΩ gfs Forward Transconductance VDS = 40V , ID=14.0A - 24 - S Ciss Input capacitance VDS=25V, VGS =0V, f=1.0MHZ - 2879 3742 pF Coss Output capacitance - 362 470 pF Crss Reverse transfer capacitance - 81 105 pF td(on) Turn-On delay time VDD=100V,ID=28A,RG=25Ω VGS =10V ( note 4,5) - 28 69 ns tr Turn-On rise time - 251 494 ns td(off) Turn-Off delay time - 309 617 ns tf Turn-Off Fall time - 220 412 ns Qg Total Gate Charge VDS =160V , ID=28A VGS =10V(note 4,5) - 103 136 nC Qgs Gate-Source charge - 16 - nC Qgd Gate-Drain charge - 53 - nC IS Maximum Continuous Drain-Source Diode Forward Current - - 28 A ISM Maximum Pulsed Drain-Source Diode Forward Current - - 112 A VSD Maximum Continuous Drain-Source Diode Forward Current VGS=0V, IS=28A - 1.4 V trr Reverse recovery time VGS=0V, IS=28A dIF/dt=100A/μs (note 4) 218 ns Qrr Reverse recovery charge 1.91 μC Notes: 1:Pulse width limited by maximum junction temperature 2:L=1.5mH, IAS=28A, VDD=50V, RG=25 Ω,Starting TJ=25℃ 3:ISD ≤28A,di/dt ≤200A/μs, VDD≤BVDSS, Starting TJ=25℃ 4:Pulse Test:Pulse Width ≤300μs, Duty Cycle≤2% 5:Essentially independent of operating temperature |
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