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APM32E103CET6-R 数据表(PDF) 54 Page - Geehy Semiconductor Co., Ltd. |
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APM32E103CET6-R 数据表(HTML) 54 Page - Geehy Semiconductor Co., Ltd. |
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54 / 79 page ![]() www.g eeh y.co m Pag e 53 Figure 15 SPI Timing Diagram - Slave Mode and CPHA=1 NSS Input MISO Output CPHA=1 CPOL=0 CPHA=1 MSB out BIT 6~1 OUT LSB OUT LSB IN Msb in BIT 6~1 IN tc(SCK) th(SI) tSU(SI) th(NSS) MOSI Input CPOL=1 SCK Input tSU(NSS) tW(SCKH) tW(SCKL) ta(SO) tV(SO) th(SO) tf(SCK) tr(SCK) tdls(SO) Note: The measuring points are set at CMOS levels: 0.3VDD and 0.7VDD . Figure 16 SPI Timing Diagram - Master Mode High NSS input MOSI output MISO input MSB IN MSB OUT BIT 6~1 IN LSB IN LSB OUT BIT 6~1 OUT CPHA=0 CPOL=0 CPHA=0 CPOL=1 CPHA=1 CPOL=0 CPHA=1 CPOL=1 tc(SCK) th(MI) tv(MO) th(MO) SCK input SCK input tW(SCKH) tW(SCKL) tSU(MI) tr(SCK) tf(SCK) Note: The measuring points are set at CMOS levels: 0.3VDD and 0.7VDD . 5.11. Analog peripherals 5.11.1. ADC Test parameter description: ⚫ Sampling rate: the number of conversion of analog quantity to digital quantity by ADC per second |
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