128 SAL-RPM

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Revision: 25-Oct-13

5

Document Number: 28354

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CAPACITANCE (C)



Fig. 6 - Typical multiplier of capacitance and standard deviation

as functions of ambient temperature

TYPICAL CAPACITANCE CHANGE AFTER

ENDURANCE TEST AT Tamb = 125 °C

Fig. 7 - Change of capacitance as a function of cumulative

frequency after endurance test

LEAKAGE CURRENT

Fig. 8 - Typical multiplier of leakage current as a function

of ambient temperature

TYPICAL LEAKAGE CURRENT CHANGE AFTER

ENDURCANCE TEST AT Tamb = 125 °C

Fig. 9 - Change of capacitance as a function of cumulative

frequency after endurance test

T

amb (°C)

0.6

0.7

0.8

0.9

1.0

1.1

1.2

C

0

C

- 80

- 40

0

40

80

120

160

0.05

0

σ

0.01 0.1 0.5 1 2

5 10 20 30 40 50 60 70 80 90 95 98 99 99.5 99.9 99.99

2000 h

5000 h

10 000 h

DC

(%)

Cumulative frequency (%)

4

2

0

- 2

- 4

- 6

- 10

- 8

10

2

10

1

10

-1

I

I

0

T

amb (°C)

- 40

0

40

80

120

160

I

0 = leakage current during continuous operation

at U

R and Tamb = 25 °C

0.01 0.1 0.5 1 2

5 10 20 30 40 50 60 70 80 90 95 98 99 99.5 99.9 99.99

Cumulative frequency (%)

100

80

60

50

40

30

20

10

8

6

5

4

3

2

1

init.

2000 h

5000 h

10 000 h