ELECTRICAL CHARACTERISTICS (continued)

Signal

Symbol

Parameter

Test Condition

Min.

Typ.

Max.

Unit

CS

Low level set-up time

to WR falling edge.

Low Level hold time from

WR rising edge.

High level set-up time to

WR falling edge.

High level hold time from

WR rising edge.

Low level set-up time

to RD falling edge.

Low Level hold time from

RD rising edge.

High level set-up time to

RD falling edge.

High level hold time from

RD rising edge.

Active Case

Active Case

Inactive Case

Inactive Case

Active Case

Active Case

Inactive Case

Inactive Case

0

20

0

20

0

0

0

0

ns

ns

ns

ns

ns

ns

ns

ns

CD

Set-up time to write strobe

end.

Hold time from write

strobe end.

Set-up time to read strobe

start.

Hold time from read

strobe end.

130

25

20

25

ns

ns

ns

ns

OS

Propagation time from

rising edge of CK.

100

ns

EC

Propagation time referred

to CK edges.

30

ns

TD/TF

Set-up

Hold Time

80

40

ns

ns

D0 to D7

(interface

bus)

Input set-up time to write

strobe end.

Input hold time from write

strobe end.

Propagation time from

(active) falling edge of

read strobe.

Propagation time from

(active) rising edge of

read strobe to high

impedance state.

CL = 200pF

130

25

120

80

ns

ns

ns

ns

A.C. TESTING, OUTPUT WAVEFORM

A.C. testing inputs are driven at 2.4V for a logic ”1” and 0.45V for a logic ”0”, timing

measurement are made at 2.0V for a logic ”1” and 0.8V for a logic ”0”.

M34116

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