M3488

November 1994

256 x 256 DIGITAL SWITCHING MATRIX

PREL IMINARY DATA

This is advanced information on a new product now in development or undergoing evaluation. Details are subject to change without notice.

.

256 INPUT AND 256 OUTPUT CHANNEL

CMOS DIGITAL SWITCHING MATRIX COM-

PATIBLE WITH M088

.

BUILDING BLOCK DESIGNED FOR LARGE

CAPACITY ELECTRONIC EXCHANGES, SUB-

SYSTEMS AND PABX

.

NO EXTRA PIN NEEDED FOR NOT-BLOCK-

ING SINGLE STAGE AND HIGHER CAPACITY

SYNTHESIS BLOCKS (512 or 1024 channels)

.

EUROPEAN TELEPHONE STANDARD COM-

PATIBLE (32 serial channels per frame)

.

PCM INPUTS AND OUTPUTS MUTUALLY

COMPATIBLE

.

ACTUAL INPUT-OUTPUT CHANNEL CON-

NECTIONS STORED AND MODIFIED VIA AN

ON CHIP 8-BIT PARALLEL MICROPROCES-

SOR INTERFACE

.

TYPICAL BIT RATE : 2Mbit/s

.

TYPICAL SYNCHRONIZATION RATE : 8KHz

(time frame is 125

µs)

.

5V P0WER SUPPLY

.

CMOS & TTL INPUT/OUTPUT LEVELS COM-

PATIBLE

.

HIGH DENSITY ADVANCED 1.2

µmHCMOS3

PROCESS

Main instructions controlled by the microproc-

essor interface

.

CHANNEL CONNECTION/DISCONNECTION

.

OUTPUT CHANNEL DISCONNECTION

.

INSERTION OF A BYTE ON A PCM OUTPUT

CHANNEL/DISCONNECTION

.

TRANSFER TO THE MICROPROCESSOR OF

A SINGLE PCM OUTPUT CHANNEL SAMPLE

.

TRANSFER TO THE MICROPROCESSOR OF

A SINGLE OUTPUT CHANNEL CONTROL

WORD

.

TRANSFER TO THE MICROPROCESSOR OF

A SELECTED 0 CHANNEL PCM INPUT DATA

DIP40

PQFP44

ORDERING NUMBERS:

M3488B1

M3488Q1

ABSOLUTE MAXIMUM RATINGS

Symbol

Parameter

Test Conditions

Unit

Supply Voltage

-0.3 to 7

V

Input Voltage

V

Off State Output Voltage

V

Current at Digital Outputs

30

mA

Total Package Power Dissipation

1.5

W

Storage Temperature Range

-65 to 150

°C

Operating Temperature Range

0 to 70

°C

Stresses above those l isted under ” Absolute Maximum Ratings” may cause permanent damage to the devi ce. This is a stress

rati ngs onl y and functional operation of the device at these or any other conditions above those indicated in the operating con-

di tions of this specificati on is not implied. Exposure to absolute maximum rating condi tio ns for extended periods may affect devi ce

reliabili ty.

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