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M48Z02 数据表(PDF) 9 Page - STMicroelectronics |
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M48Z02 数据表(HTML) 9 Page - STMicroelectronics |
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9 / 12 page ![]() DATA RETENTION MODE With valid VCC applied, the M48Z02/12 operates as a conventional BYTEWIDE ™ static RAM. Should the supply voltage decay, the RAM will automat- ically power-fail deselect, write protecting itself when VCC falls within the VPFD(max), VPFD(min) window. All outputs become high impedance, and all inputs are treated as "don’t care." Note: A power failure during a write cycle may corrupt data at the currently addressed location, but does not jeopardize the rest of the RAM’s content. At voltages below VPFD(min), the user can be assured the memory will be in a write protected state, provided the VCC fall time is not less than tF. The M48Z02/12 may respond to transient noise spikes on VCC that reach into the deselect window during the time the device is sampling VCC. There- fore, decoupling of the power supply lines is rec- ommended. The power switching circuit connects external VCC to the RAM and disconnects the battery when VCC rises above VSO. As VCC rises, the battery voltage is checked. If the voltage is too low, an internal Battery Not OK (BOK) flag will be set. The BOK flag can be checked after power up. If the BOK flag is set, the first write attempted will be blocked. The flag is automatically cleared after the first write, and normal RAM operation resumes. Figure 9 illus- trates how a BOK check routine could be struc- tured. POWER SUPPLY DECOUPLING and UNDER- SHOOT PROTECTION ICC transients, including those produced by output switching, can produce voltage fluctuations, result- ing in spikes on the VCC bus. These transients can be reduced if capacitors are used to store energy, which stabilizes the VCC bus. The energy stored in the bypass capacitors will be released as low going spikes are generated or energy will be absorbed when overshoots occur. A ceramic bypass capaci- tor value of 0.1 µF (as shown in Figure 10) is recommended in order to provide the needed filter- ing. In addition to transients that are caused by normal SRAM operation, power cycling can generate negative voltage spikes on VCC that drive it to values below VSS by as much as one Volt. These negative spikes can cause data corruption in the SRAM while in battery backup mode. To protect from these voltage spikes, it is recommeded to connect a schottky diode from VCC to VSS (cathode connected to VCC, anode to VSS). Schottky diode 1N5817 is recommended for through hole and MBRS120T3 is recommended for surface mount. READ DATA AT ANY ADDRESS AI00607 IS DATA COMPLEMENT OF FIRST READ? (BATTERY OK) POWER-UP YES NO WRITE DATA COMPLEMENT BACK TO SAME ADDRESS READ DATA AT SAME ADDRESS AGAIN NOTIFY SYSTEM OF LOW BATTERY (DATA MAY BE CORRUPTED) WRITE ORIGINAL DATA BACK TO SAME ADDRESS (BATTERY LOW) CONTINUE Figure 9. Checking the BOK Flag Status AI02169 VCC 0.1 µF DEVICE VCC VSS Figure 10. Supply Voltage Protection 9/12 M48Z02, M48Z12 |
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