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M48Z08 数据表(PDF) 4 Page - STMicroelectronics |
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M48Z08 数据表(HTML) 4 Page - STMicroelectronics |
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4 / 18 page ![]() Symbol Parameter Test Condition Min Max Unit ILI (1) Input Leakage Current 0V ≤ VIN ≤ VCC ±1 µA ILO (1) Output Leakage Current 0V ≤ VOUT ≤ VCC ±5 µA ICC Supply Current Outputs open 80 mA ICC1 Supply Current (Standby) TTL E = VIH 3mA ICC2 Supply Current (Standby) CMOS E = VCC – 0.2V 3 mA VIL (2) Input Low Voltage –0.3 0.8 V VIH Input High Voltage 2.2 VCC + 0.3 V VOL Output Low Voltage IOL = 2.1mA 0.4 V VOH Output High Voltage IOH = –1mA 2.4 V Notes: 1. Outputs deselects. 2. Negative spikes of –1V allowed for up to 10ns once per cycle. Table 6. DC Characteristics (TA = 0 to 70 °C; VCC = 4.75V to 5.5V or 4.5V to 5.5V) Symbol Parameter Test Condition Min Max Unit CIN Input Capacitance VIN = 0V 10 pF CIO (3) Input / Output Capacitance VOUT = 0V 10 pF Notes: 1. Effective capacitance measured with power supply at 5V. 2. Sampled only, not 100% tested. 3. Outputs deselected Table 5. Capacitance (1, 2) (TA = 25 °C) Symbol Parameter Min Typ Max Unit VPFD Power-fail Deselect Voltage (M48Z08) 4.5 4.6 4.75 V VPFD Power-fail Deselect Voltage (M48Z18) 4.2 4.3 4.5 V VSO Battery Back-up Switchover Voltage 3.0 V tDR Expected Data Retention Time 11 YEARS Note: 1. All voltages referenced to VSS. Table 7. Power Down/Up Trip Points DC Characteristics (1) (TA = 0 to 70 °C) For the 28 lead SOIC, the battery package (i.e. SNAPHAT) part number is "M4Z28-BR00SH1". The M48Z08/18 also has its own Power-fail Detect circuit. The control circuitry constantly monitors the single 5V supply for an out of tolerance condition. When VCC is out of tolerance, the circuit write protects the SRAM, providing a high degree of data security in the midst of unpredictable system op- eration brought on by low VCC. As VCC falls below approximately 3V, the control circuitry connects the battery which maintains data until valid power re- turns. DESCRIPTION (cont’d) 4/18 M48Z08, M48Z18 |
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