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APM32F103RBT7-R 数据表(PDF) 52 Page - Geehy Semiconductor Co., Ltd. |
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APM32F103RBT7-R 数据表(HTML) 52 Page - Geehy Semiconductor Co., Ltd. |
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52 / 78 page ![]() w w w. g e e h y. c o m P a g e 51 Table40 USBD Full-speed Electrical Characteristics (VDD=3.0~3.6V, TA =25℃) Symbol Parameter Condition Minimum value Maximum value Unit tr Rise time CL = 50pF 4 20 ns tf Fall time CL = 50pF 4 20 ns trfm Match of rise and fall time tr / tf 90 110 % VCRS Output signal crossover voltage - 1.3 2.0 V 5.12 Analog peripherals 5.12.1 ADC Test parameter description: Sampling rate: The number of conversion of analog quantity to digital quantity by ADC per second Sample rate=ADC clock/(number of sampling periods + number of conversion periods) 5.12.1.1 12-bit ADC characteristics Table41 Characteristics of 12-bit ADC (VDD =2.4~3.6V, TA =-40~105℃) Symbol Parameter Condition Minimum value Typical value Maximu m value Unit VDDA Supply voltage - 2.4 - 3.6 V VREF+ Positive reference voltage - 2.4 - VDDA V IVREF Current on VREF input pin - - 260 484 μA fADC ADC clock frequency - 0.6 - 14 MHz fS Sampling rate - 0.05 - 1 MHz VAIN Conversion voltage range - 0 - VREF+ V tCAL Calibration time fADC = 14MHz 5.9 μs - 83 1/fADC RADC Sampling resistor - 1 kΩ CADC Sample and hold capacitance - 12 Pf |
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