The data contained at this address is then clocked

out serially. The address pointer is automatically

incremented after the data is output and, if the Chip

Select input (S) is held High, the ST93C06 can

output a sequential stream of data bytes/words. In

this way, the memory can be read as a data stream

from 8 to 256 bits long, or continuously as the

address counter automatically rolls over to ’00’

when the highest address is reached. Program-

ming is internally self-timed (the external clock

signal on C input may be disconnected or left

running after the start of a Write cycle) and does

not require an erase cycle prior to the Write instruc-

tion. The Write instruction writes 8 or 16 bits at one

time into one of the 32 bytes or 16 words. After the

start of the programming cycle aBusy/Ready signal

is available on the Data output (Q) when Chip

Select (S) is driven High.

The design of the ST93C06 and the High Endur-

ance CMOS technologyused for its fabrication give

an Erase/Write cycle Endurance of 1,000,000 cy-

cles and a data retention of 40 years.

VSS

Q

ORG

DU

C

SVCC

D

AI00817B

ST93C06

ST93C06C

1

2

3

4

8

7

6

5

Figure 2A. DIP Pin Connections

1

VSS

Q

ORG

DU

C

SVCC

D

AI00818C

ST93C06

ST93C06C

2

3

4

8

7

6

5

Figure 2B. SO Pin Connections

DESCRIPTION (cont’d)

Warning: DU = Don’t Use

Warning: DU = Don’t Use

Symbol

Parameter

Value

Unit

Ambient Operating Temperature

–40 to 125

°C

Storage Temperature

–65 to 150

°C

Lead Temperature, Soldering

(SO8 package)

(PSDIP8 package)

40 sec

10 sec

215

260

°C

V

Supply Voltage

–0.3 to 6.5

V

Electrostatic Discharge Voltage (Human Body model)

(2)

ST93C06

ST93C06C

2000

4000

V

Electrostatic Discharge Voltage (Machine model)

(3)

ST93C06

ST93C06C

500

500

V

Notes: 1. Except for the rating ”Operating Temperature Range”, stresses above those listed in the Table ”Absolute Maximum Ratings”

may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other

conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum

Rating conditions for extended periods may affect device reliability. Refer also to the SGS-THOMSON SURE Program and other

relevant quality documents.

2. MIL-STD-883C, 3015.7 (100pF, 1500

Ω).

3. EIAJ IC-121 (Condition C) (200pF, 0

Ω).

2/15

ST93C06, ST93C06C